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System and device for reducing instantaneous voltage droop during a scan shift operation |
Sandeep Kumar Goel, Arun Gunda |
2014-01-07 |
| 8515695 |
Method and an apparatus for evaluating small delay defect coverage of a test pattern set on an IC |
Sandeep Kumar Goel |
2013-08-20 |
| 8412994 |
Design-for-test technique to reduce test volume including a clock gate controller |
— |
2013-04-02 |
| 8352818 |
Method for generating test patterns for small delay defects |
Sandeep Kumar Goel, Ritesh P. Turakhia |
2013-01-08 |
| 8140923 |
Test circuit and method for testing of infant mortality related defects |
Sandeep Kumar Goel |
2012-03-20 |
| 7802159 |
Enhanced logic built-in self-test module and method of online system testing employing the same |
Sreejit Chakravarty, Fan Yang |
2010-09-21 |
| 7555688 |
Method for implementing test generation for systematic scan reconfiguration in an integrated circuit |
Ahmad Alvamani, Arun Gunda |
2009-06-30 |
| 7461307 |
System and method for improving transition delay fault coverage in delay fault tests through use of an enhanced scan flip-flop |
Arun Gunda |
2008-12-02 |
| 7461315 |
Method and system for improving quality of a circuit through non-functional test pattern identification |
Arun Gunda |
2008-12-02 |
| 7293210 |
System and method for improving transition delay fault coverage in delay fault tests through use of transition launch flip-flop |
Arun Gunda |
2007-11-06 |
