Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7305634 | Method to selectively identify at risk die based on location within the reticle | Manu Rehani, Kevin Cota | 2007-12-04 |
| 7079963 | Modified binary search for optimizing efficiency of data collection time | Cary Gloor, Robert Brady Benware | 2006-07-18 |
| 7073107 | Adaptive defect based testing | Vijayashanker Rajagopalan | 2006-07-04 |
| 6943042 | Method of detecting spatially correlated variations in a parameter of an integrated circuit die | Kevin Cota, Bruce Whitefield | 2005-09-13 |
| 6931297 | Feature targeted inspection | — | 2005-08-16 |
| 6807655 | Adaptive off tester screening method based on intrinsic die parametric measurements | Manu Rehani, Kevin Cota, David Abercrombie | 2004-10-19 |
| 6787379 | Method of detecting spatially correlated variations in a parameter of an integrated circuit die | Kevin Cota, Bruce Whitefield | 2004-09-07 |
| 6782500 | Statistical decision system | Emery Sugasawara, W. Robert Daasch, James McNames, Daniel R. Bockelman, Kevin Cota | 2004-08-24 |
| 6682947 | Feed forward testing | — | 2004-01-27 |
| 6647348 | Latent defect classification system | — | 2003-11-11 |
| 6624048 | Die attach back grinding | — | 2003-09-23 |
| 6601008 | Parametric device signature | — | 2003-07-29 |
| 6598194 | Test limits based on position | Emery Sugasawara, W. Robert Daasch, James McNames, Daniel R. Bockelman, Kevin Cota | 2003-07-22 |
| 6532431 | Ratio testing | — | 2003-03-11 |
| 6476631 | Defect screening using delta VDD | — | 2002-11-05 |
| 4985888 | Token ring system hierarchy | David Alan Woodfield | 1991-01-15 |
| 4905230 | Token ring expander and/or hub | David Alan Woodfield | 1990-02-27 |