| 7305634 |
Method to selectively identify at risk die based on location within the reticle |
Manu Rehani, Kevin Cota |
2007-12-04 |
| 7079963 |
Modified binary search for optimizing efficiency of data collection time |
Cary Gloor, Robert Brady Benware |
2006-07-18 |
| 7073107 |
Adaptive defect based testing |
Vijayashanker Rajagopalan |
2006-07-04 |
| 6943042 |
Method of detecting spatially correlated variations in a parameter of an integrated circuit die |
Kevin Cota, Bruce Whitefield |
2005-09-13 |
| 6931297 |
Feature targeted inspection |
— |
2005-08-16 |
| 6807655 |
Adaptive off tester screening method based on intrinsic die parametric measurements |
Manu Rehani, Kevin Cota, David Abercrombie |
2004-10-19 |
| 6787379 |
Method of detecting spatially correlated variations in a parameter of an integrated circuit die |
Kevin Cota, Bruce Whitefield |
2004-09-07 |
| 6782500 |
Statistical decision system |
Emery Sugasawara, W. Robert Daasch, James McNames, Daniel R. Bockelman, Kevin Cota |
2004-08-24 |
| 6682947 |
Feed forward testing |
— |
2004-01-27 |
| 6647348 |
Latent defect classification system |
— |
2003-11-11 |
| 6624048 |
Die attach back grinding |
— |
2003-09-23 |
| 6601008 |
Parametric device signature |
— |
2003-07-29 |
| 6598194 |
Test limits based on position |
Emery Sugasawara, W. Robert Daasch, James McNames, Daniel R. Bockelman, Kevin Cota |
2003-07-22 |
| 6532431 |
Ratio testing |
— |
2003-03-11 |
| 6476631 |
Defect screening using delta VDD |
— |
2002-11-05 |
| 4985888 |
Token ring system hierarchy |
David Alan Woodfield |
1991-01-15 |
| 4905230 |
Token ring expander and/or hub |
David Alan Woodfield |
1990-02-27 |
