Issued Patents All Time
Showing 1–25 of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7354790 | Method and apparatus for avoiding dicing chip-outs in integrated circuit die | Parthasarathy Rajagopalan, Zafer Kutlu, Charles E. VONDERACH, Dilip Vijay, Yogendra Ranade +2 more | 2008-04-08 |
| 6782500 | Statistical decision system | Robert Madge, W. Robert Daasch, James McNames, Daniel R. Bockelman, Kevin Cota | 2004-08-24 |
| 6687661 | Utilizing a technology-independent system description incorporating a metal layer dependent attribute | Stefan Graef | 2004-02-03 |
| 6598194 | Test limits based on position | Robert Madge, W. Robert Daasch, James McNames, Daniel R. Bockelman, Kevin Cota | 2003-07-22 |
| 6278129 | Corrosion sensitivity structures for vias and contact holes in integrated circuits | Donald J. Esses | 2001-08-21 |
| 6239609 | Reduced voltage quiescent current test methodology for integrated circuits | Ronnie Vasishta, Victer Chan | 2001-05-29 |
| 6221681 | On-chip misalignment indication | — | 2001-04-24 |
| 6189131 | Method of selecting and synthesizing metal interconnect wires in integrated circuits | Stefan Graef | 2001-02-13 |
| 6185706 | Performance monitoring circuitry for integrated circuits | — | 2001-02-06 |
| 6124143 | Process monitor circuitry for integrated circuits | — | 2000-09-26 |
| 6103615 | Corrosion sensitivity structures for vias and contact holes in integrated circuits | Donald J. Esses | 2000-08-15 |
| 6102962 | Method for estimating quiescent current in integrated circuits | Stefan Graef | 2000-08-15 |
| 6101458 | Automatic ranging apparatus and method for precise integrated circuit current measurements | V. Swamy Irrinki, Sudhakar R. Gouravaram | 2000-08-08 |
| 6097884 | Probe points and markers for critical paths and integrated circuits | — | 2000-08-01 |
| 6083848 | Removing solder from integrated circuits for failure analysis | Kevin Weaver, Jay Sherman Hidy | 2000-07-04 |
| 6064220 | Semiconductor integrated circuit failure analysis using magnetic imaging | Stefan Graef | 2000-05-16 |
| 6061814 | Test circuitry for determining the defect density of a semiconductor process as a function of individual metal layers | V. Swamy Irrinki | 2000-05-09 |
| 6043672 | Selectable power supply lines for isolating defects in integrated circuits | — | 2000-03-28 |
| 6043539 | Electro-static discharge protection of CMOS integrated circuits | — | 2000-03-28 |
| 6037796 | Current waveform analysis for testing semiconductor devices | Stefan Graef | 2000-03-14 |
| 6013533 | Real time quiescent current test limit methodology | Scott KELLER | 2000-01-11 |
| 5998853 | Methods and apparatus for electrical marking of integrated circuits to record manufacturing test results | — | 1999-12-07 |
| 5972541 | Reticle and method of design to correct pattern for depth of focus problems | Mario Garza | 1999-10-26 |
| 5953518 | Yield improvement techniques through layout optimization | Sudhakar R. Gouravaram, Mandar DANGE | 1999-09-14 |
| 5936876 | Semiconductor integrated circuit core probing for failure analysis | — | 1999-08-10 |