Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7390680 | Method to selectively identify reliability risk die based on characteristics of local regions on the wafer | Ramon Gonzales, Manu Rehani, David Abercrombie | 2008-06-24 |
| 7305634 | Method to selectively identify at risk die based on location within the reticle | Manu Rehani, Robert Madge | 2007-12-04 |
| 6943042 | Method of detecting spatially correlated variations in a parameter of an integrated circuit die | Robert Madge, Bruce Whitefield | 2005-09-13 |
| 6880140 | Method to selectively identify reliability risk die based on characteristics of local regions on the wafer | Ramon Gonzales, Manu Rehani, David Abercrombie | 2005-04-12 |
| 6807655 | Adaptive off tester screening method based on intrinsic die parametric measurements | Manu Rehani, David Abercrombie, Robert Madge | 2004-10-19 |
| 6787379 | Method of detecting spatially correlated variations in a parameter of an integrated circuit die | Robert Madge, Bruce Whitefield | 2004-09-07 |
| 6782500 | Statistical decision system | Robert Madge, Emery Sugasawara, W. Robert Daasch, James McNames, Daniel R. Bockelman | 2004-08-24 |
| 6598194 | Test limits based on position | Robert Madge, Emery Sugasawara, W. Robert Daasch, James McNames, Daniel R. Bockelman | 2003-07-22 |