Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7390680 | Method to selectively identify reliability risk die based on characteristics of local regions on the wafer | Kevin Cota, Manu Rehani, David Abercrombie | 2008-06-24 |
| 6880140 | Method to selectively identify reliability risk die based on characteristics of local regions on the wafer | Kevin Cota, Manu Rehani, David Abercrombie | 2005-04-12 |
| D490215 | Necktie holder | — | 2004-05-25 |