| 11635462 |
Library cell modeling for transistor-level test pattern generation |
Wu-Tung Cheng, Takeo Kobayashi, Andreas Glowatz |
2023-04-25 |
| 10977400 |
Deterministic test pattern generation for designs with timing exceptions |
Wu-Tung Cheng, Kun-Han Tsai, Naixing Wang, Chen Wang, Mark Kassab +1 more |
2021-04-13 |
| 10509073 |
Timing-aware test generation and fault simulation |
Kun-Han Tsai, Mark Kassab, Chen Wang, Janusz Rajski |
2019-12-17 |
| 10372855 |
Scan cell selection for partial scan designs |
Ting-Pu Tai, Wu-Tung Cheng, Takeo Kobayashi |
2019-08-06 |
| 10222420 |
Transition test generation for detecting cell internal defects |
Wu-Tung Cheng, Janusz Rajski |
2019-03-05 |
| 9720040 |
Timing-aware test generation and fault simulation |
Kun-Han Tsai, Mark Kassab, Chen Wang, Janusz Rajski |
2017-08-01 |
| 9568552 |
Logic built-in self-test with high test coverage and low switching activity |
Janusz Rajski |
2017-02-14 |
| 9501589 |
Identification of power sensitive scan cells |
Yu Huang, Wu-Tung Cheng |
2016-11-22 |
| 9335374 |
Dynamic shift for test pattern compression |
Mark Kassab, Janusz Rajski |
2016-05-10 |
| 9086454 |
Timing-aware test generation and fault simulation |
Kun-Han Tsai, Mark Kassab, Chen Wang, Janusz Rajski |
2015-07-21 |
| 8996941 |
Test data volume reduction based on test cube properties |
Janusz Rajski |
2015-03-31 |
| 8890563 |
Scan cell use with reduced power consumption |
Janusz Rajski |
2014-11-18 |
| 8560906 |
Timing-aware test generation and fault simulation |
Kun-Han Tsai, Mark Kassab, Chen Wang, Janusz Rajski |
2013-10-15 |
| 8499209 |
At-speed scan testing with controlled switching activity |
Janusz Rajski, Elham K. Moghaddam, Nilanjan Mukherjee, Mark Kassab |
2013-07-30 |
| 8290738 |
Low power scan testing techniques and apparatus |
Dariusz Czysz, Mark Kassab, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer |
2012-10-16 |
| 8051352 |
Timing-aware test generation and fault simulation |
Kun-Han Tsai, Mark Kassab, Chen Wang, Janusz Rajski |
2011-11-01 |
| 7925465 |
Low power scan testing techniques and apparatus |
Dariusz Czysz, Mark Kassab, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer |
2011-04-12 |
| 7865792 |
Test generation methods for reducing power dissipation and supply currents |
Janusz Rajski |
2011-01-04 |
| 7685491 |
Test generation methods for reducing power dissipation and supply currents |
Janusz Rajski |
2010-03-23 |
| 6378096 |
On-line partitioning for sequential circuit test generation |
Srimat Chakradhar, Kiran B. Doreswamy, Surendra K. Bommu |
2002-04-23 |