Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11635462 | Library cell modeling for transistor-level test pattern generation | Xijiang Lin, Wu-Tung Cheng, Takeo Kobayashi | 2023-04-25 |
| 8990760 | Cell-aware fault model generation for delay faults | Friedrich Hapke, Wilfried Redemund, Juergen Schloeffel | 2015-03-24 |
| 8689069 | Multi-targeting boolean satisfiability-based test pattern generation | Rene Krenz-Baath, Friedrich Hapke | 2014-04-01 |
| 7376873 | Method and system for selectively masking test responses | Hendrikus Petrus Elisabeth Vranken, Friedrich Hapke | 2008-05-20 |
| 6789219 | Arrangement and method of testing an integrated circuit | Friedrich Hapke, Ruediger Solbach | 2004-09-07 |