Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8990760 | Cell-aware fault model generation for delay faults | Friedrich Hapke, Wilfried Redemund, Andreas Glowatz | 2015-03-24 |
| 8423845 | On-chip logic to log failures during production testing and enable debugging for failure diagnosis | Friedrich Hapke, Michael Wittke, Rene Krenz-Baath | 2013-04-16 |
| 8250420 | Testable integrated circuit and test data generation method | Friedrich Hapke, Michael Wittke | 2012-08-21 |