Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8448008 | High speed clock control | Friedrich Hapke, Sascha Ochsenknecht, Thomas Hans Rinderknecht | 2013-05-21 |
| 8423845 | On-chip logic to log failures during production testing and enable debugging for failure diagnosis | Friedrich Hapke, Juergen Schloeffel, Rene Krenz-Baath | 2013-04-16 |
| 8250420 | Testable integrated circuit and test data generation method | Friedrich Hapke, Juergen Schloeffel | 2012-08-21 |
| 8112686 | Deterministic logic built-in self-test stimuli generation | Friedrich Hapke, Reinhard Meier | 2012-02-07 |
| 8103925 | On-chip logic to support compressed X-masking for BIST | Friedrich Hapke, Reinhard Meier | 2012-01-24 |
| 7870453 | Circuit arrangement and method of testing an application circuit provided in said circuit arrangement | Friedrich Hapke | 2011-01-11 |