Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11237211 | Microchip having a plurality of reconfigurable test structures | — | 2022-02-01 |
| 8689069 | Multi-targeting boolean satisfiability-based test pattern generation | Andreas Glowatz, Friedrich Hapke | 2014-04-01 |
| 8423845 | On-chip logic to log failures during production testing and enable debugging for failure diagnosis | Friedrich Hapke, Juergen Schloeffel, Michael Wittke | 2013-04-16 |