Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8726112 | Scan test application through high-speed serial input/outputs | Janusz Rajski, Nilanjan Mukherjee, Mark Kassab, Mohamed Dessouky | 2014-05-13 |
| 8448008 | High speed clock control | Friedrich Hapke, Michael Wittke, Sascha Ochsenknecht | 2013-05-21 |
| 8448032 | Performance of signature-based diagnosis for logic BIST | Manish Sharma, Wu-Tung Cheng | 2013-05-21 |
| 8280687 | Direct fault diagnostics using per-pattern compactor signatures | Wu-Tung Cheng, Manish Sharma | 2012-10-02 |
| 7840865 | Built-in self-test of integrated circuits using selectable weighting of test patterns | Liyang Lai, Wu-Tung Cheng | 2010-11-23 |
| 7644333 | Restartable logic BIST controller | Christopher John Hill | 2010-01-05 |
| 7296249 | Using constrained scan cells to test integrated circuits | Wu-Tung Cheng | 2007-11-13 |
| 6920597 | Uniform testing of tristate nets in logic BIST | Randy Klingenberg, Nagesh Tamarapalli | 2005-07-19 |
| 6295315 | Jitter measurement system and method | Arnold M. Frisch | 2001-09-25 |