Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
CW

Chen Wang — 22 Patents

MGMentor Graphics: 10 patents #25 of 698Top 4%
SSSiemens Industry Software: 1 patents #111 of 391Top 30%
Tigard, OR: #36 of 696 inventorsTop 6%
Oregon: #1,944 of 28,073 inventorsTop 7%
Overall (All Time): #189,202 of 4,157,543Top 5%
22 Patents All Time
Chen Wang has been granted 22 US patents while listed as an inventor at Mentor Graphics. The first was granted in 2007 and the most recent in May 2022. Chen Wang ranks #189,202 of 4,157,543 US inventors in our database (top 4.6%). Patent records list Chen Wang in Tigard, OR, US.

Issued Patents All Time

Showing 1–22 of 22 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
11320487 Programmable test compactor for improving defect determination Wu-Tung Cheng, Mark Kassab 2022-05-03
11090799 Socket holder and socket rack including the same 2021-08-17
10977400 Deterministic test pattern generation for designs with timing exceptions Wu-Tung Cheng, Kun-Han Tsai, Naixing Wang, Xijiang Lin, Mark Kassab +1 more 2021-04-13
10632606 Socket holder and socket rack including the same 2020-04-28
10509073 Timing-aware test generation and fault simulation Xijiang Lin, Kun-Han Tsai, Mark Kassab, Janusz Rajski 2019-12-17
9720040 Timing-aware test generation and fault simulation Xijiang Lin, Kun-Han Tsai, Mark Kassab, Janusz Rajski 2017-08-01
9651622 Isometric test compression with low toggling activity Janusz Rajski, Amit Amar Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee +1 more 2017-05-16
9086454 Timing-aware test generation and fault simulation Xijiang Lin, Kun-Han Tsai, Mark Kassab, Janusz Rajski 2015-07-21 $3,247,000
8560906 Timing-aware test generation and fault simulation Xijiang Lin, Kun-Han Tsai, Mark Kassab, Janusz Rajski 2013-10-15 $5,423,000
8201131 Generating test patterns having enhanced coverage of untargeted defects Janusz Rajski, Huaxing Tang 2012-06-12 $12,543,000
8051352 Timing-aware test generation and fault simulation Xijiang Lin, Kun-Han Tsai, Mark Kassab, Janusz Rajski 2011-11-01 $4,434,000
7962820 Fault diagnosis of compressed test responses Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer 2011-06-14 $8,085,000
7890827 Compressing test responses using a compactor Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Artur Pogiel 2011-02-15 $4,893,000
7765450 Methods for distribution of test generation programs Jon Udell, Mark Kassab, Janusz Rajski 2010-07-27
7743302 Compressing test responses using a compactor Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Artur Pogiel 2010-06-22
7669101 Methods for distributing programs for generating test data Jon Udell, Mark Kassab, Janusz Rajski 2010-02-23
7509600 Generating test patterns having enhanced coverage of untargeted defects Janusz Rajski, Huaxing Tang 2009-03-24
7509550 Fault diagnosis of compressed test responses Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer 2009-03-24
7437640 Fault diagnosis of compressed test responses having one or more unknown states Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer 2008-10-14
7386778 Methods for distributing programs for generating test data Jon Udell, Mark Kassab, Janusz Rajski 2008-06-10
7370254 Compressing test responses using a compactor Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Artur Pogiel 2008-05-06
7302624 Adaptive fault diagnosis of compressed test responses Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer 2007-11-27