Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11423202 | Suspect resolution for scan chain defect diagnosis | Grzegorz Mrugalski, Szczepan Urban | 2022-08-23 |
| 11227091 | Physical failure analysis-oriented diagnosis resolution prediction | Huaxing Tang | 2022-01-18 |
| 11156661 | Reversible multi-bit scan cell-based scan chains for improving chain diagnostic resolution | Wu-Tung Cheng, Szczepan Urban, Manish Sharma, Yu Huang | 2021-10-26 |
| 11106848 | Diagnostic resolution enhancement with reversible scan chains | Wu-Tung Cheng, Szczepan Urban, Manish Sharma, Yu Huang | 2021-08-31 |
| 11042679 | Diagnosis resolution prediction | Huaxing Tang | 2021-06-22 |
| 10955460 | Test scheduling and test access in test compression environment | Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer | 2021-03-23 |
| 10796043 | Non-adaptive pattern reordering to improve scan chain diagnostic resolution in circuit design and manufacture | Yu Huang, Szczepan Urban | 2020-10-06 |
| 9088522 | Test scheduling with pattern-independent test access mechanism | Janusz Rajski, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Jerzy Tyszer +1 more | 2015-07-21 |