| 12416224 |
Active energy-absorbing shock absorber for perforation combined well testing |
Liangliang Ding, Kai Wang, Jialin Tian, Hongtao Liu, Yongzhi Xue +2 more |
2025-09-16 |
| 11951460 |
Preparation method and application of tailings-based zeolite@CDs-TiO2 composite photocatalyst |
Xianshu Dong, Yuping Fan, Xiaomin Ma, Jiaqi Guo, Yuanpeng Fu |
2024-04-09 |
| 11573873 |
Adaptive cell-aware test model for circuit diagnosis |
Ting-Pu Tai |
2023-02-07 |
| 11379649 |
Advanced cell-aware fault model for yield analysis and physical failure analysis |
Brian Archer |
2022-07-05 |
| 11334698 |
Cell-aware defect characterization by considering inter-cell timing |
Emil Gizdarski, Xiaolei Cai |
2022-05-17 |
| 10528692 |
Cell-aware defect characterization for multibit cells |
Brian Archer, Kevin Chau, Xiaolei Cai |
2020-01-07 |
| 10515167 |
Cell-aware defect characterization and waveform analysis using multiple strobe points |
Brian Archer, William A. Lloyd, Christopher Kevin Allsup, Xiaolei Cai, Kevin Chau |
2019-12-24 |
| 9977080 |
Generating test sets for diagnosing scan chain failures |
Yu Huang, Wu-Tung Cheng |
2018-05-22 |
| 9689918 |
Test access architecture for stacked memory and logic dies |
Wu-Tung Cheng, Yu Huang, Liyang Lai, Etienne Racine, Martin Keim +3 more |
2017-06-27 |
| 9335376 |
Test architecture for characterizing interconnects in stacked designs |
Wu-Tung Cheng, Yu Huang, Liyang Lai, Jing Ye, Yu Hu |
2016-05-10 |
| 9222978 |
Two-dimensional scan architecture |
Yu Huang, Wu-Tung Cheng, Manish Sharma, Liyang Lai |
2015-12-29 |
| 9110138 |
Fault dictionary based scan chain failure diagnosis |
Yu Huang, Wu-Tung Cheng |
2015-08-18 |
| 9086459 |
Detection and diagnosis of scan cell internal defects |
Liyang Lai, Yu Huang, Wu-Tung Cheng |
2015-07-21 |
| 9057762 |
Faulty chains identification without masking chain patterns |
Yu Huang, Wu-Tung Cheng, Manish Sharma |
2015-06-16 |
| 9015543 |
Diagnosis-aware scan chain stitching |
Yu Huang, Wu-Tung Cheng, Liyang Lai |
2015-04-21 |
| 8935582 |
Generating test sets for diagnosing scan chain failures |
Yu Huang, Wu-Tung Cheng |
2015-01-13 |
| 8862956 |
Compound hold-time fault diagnosis |
Yu Huang, Wu-Tung Cheng, Ting-Pu Tai, Liyang Lai |
2014-10-14 |
| 8689070 |
Method and system for scan chain diagnosis |
Yu Huang, Wu-Tung Cheng, Ting-Pu Tai |
2014-04-01 |
| 8661304 |
Test pattern generation for diagnosing scan chain failures |
Wu-Tung Cheng, Yu Huang |
2014-02-25 |
| 8615695 |
Fault dictionary-based scan chain failure diagnosis |
Yu Huang, Wu-Tung Cheng |
2013-12-24 |
| 8527232 |
Diagnostic test pattern generation for small delay defect |
Wu-Tung Cheng, Takeo Kobayashi, Kun-Han Tsai |
2013-09-03 |
| 8468409 |
Speed-path debug using at-speed scan test patterns |
Wu-Tung Cheng, Kun-Han Tsai |
2013-06-18 |
| 8316265 |
Test pattern generation for diagnosing scan chain failures |
Wu-Tung Cheng, Yu Huang |
2012-11-20 |
| 8261142 |
Generating test sets for diagnosing scan chain failures |
Yu Huang, Wu-Tung Cheng |
2012-09-04 |
| 7788561 |
Diagnosing mixed scan chain and system logic defects |
Yu Huang, Wu-Tung Cheng |
2010-08-31 |