Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9689918 | Test access architecture for stacked memory and logic dies | Wu-Tung Cheng, Ruifeng Guo, Yu Huang, Liyang Lai, Martin Keim +3 more | 2017-06-27 |
| 9389944 | Test access architecture for multi-die circuits | Ronald Press, Martin Keim, Jean-Francois Cote | 2016-07-12 |
| 9389945 | Test access architecture for stacked dies | Ronald Press, Martin Keim, Jean-Francois Cote | 2016-07-12 |