Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7437636 | Method and apparatus for at-speed testing of digital circuits | Janusz Rajski, Robert L. Thompson, Nagesh Tamarapalli | 2008-10-14 |
| 6966021 | Method and apparatus for at-speed testing of digital circuits | Janusz Rajski, Robert L. Thompson, Nagesh Tamarapalli | 2005-11-15 |
| 5349587 | Multiple clock rate test apparatus for testing digital systems | Benoit Nadeau-Dostie, Dwayne Burek, Stephen K. Sunter | 1994-09-20 |