Issued Patents All Time
Showing 25 most recent of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11455447 | Activity coverage assessment of circuit designs under test stimuli | — | 2022-09-27 |
| 10353789 | Analog fault simulation control with multiple circuit representations | Tina Najibi, Mark Hanson | 2019-07-16 |
| 9372946 | Defect injection for transistor-level fault simulation | — | 2016-06-21 |
| 9134374 | Circuit and method for measuring delays between edges of signals of a circuit | — | 2015-09-15 |
| 8489947 | Circuit and method for simultaneously measuring multiple changes in delay | — | 2013-07-16 |
| 7453255 | Circuit and method for measuring delay of high speed signals | Aubin P. J. Roy | 2008-11-18 |
| 7219282 | Boundary scan with strobed pad driver enable | Pierre Gauthier, Benoit Nadeau-Dostie | 2007-05-15 |
| 7159159 | Circuit and method for adding parametric test capability to digital boundary scan | — | 2007-01-02 |
| 7158899 | Circuit and method for measuring jitter of high speed signals | Aubin P. J. Roy | 2007-01-02 |
| 6961871 | Method, system and program product for testing and/or diagnosing circuits using embedded test controller access data | Givargis Avareh Danialy, Stephen V. Pateras, Michael Howells, Martin J. Bell, Charles Mc Donald | 2005-11-01 |
| 6895535 | Circuit and method for testing high speed data circuits | Aubin P. J. Roy | 2005-05-17 |
| 6885213 | Circuit and method for accurately applying a voltage to a node of an integrated circuit | — | 2005-04-26 |
| 6717415 | Circuit and method for determining the location of defect in a circuit | — | 2004-04-06 |
| 6703820 | Method and circuit for testing high frequency mixed signal circuits with low frequency signals | — | 2004-03-09 |
| 6691269 | Method for scan controlled sequential sampling of analog signals and circuit for use therewith | — | 2004-02-10 |
| 6590412 | Circuit and method for detecting transient voltages on a dc power supply rail | — | 2003-07-08 |
| 6586921 | Method and circuit for testing DC parameters of circuit input and output nodes | — | 2003-07-01 |
| 6567971 | Circuit synthesis method using technology parameters extracting circuit | Walter H. Banzhaf, Aubin P. J. Roy | 2003-05-20 |
| 6492798 | Method and circuit for testing high frequency mixed signal circuits with low frequency signals | — | 2002-12-10 |
| 6396889 | Method and circuit for built in self test of phase locked loops | Aubin P. J. Roy | 2002-05-28 |
| 6211803 | Test circuit and method for measuring switching point voltages and integral non-linearity (INL) of analog to digital converters | — | 2001-04-03 |
| 6204694 | Programmable clock signal generation circuits and methods for generating accurate, high frequency, clock signals | Aubin P. J. Roy | 2001-03-20 |
| 5923676 | Bist architecture for measurement of integrated circuit delays | Benoit Nadeau-Dostie | 1999-07-13 |
| 5659312 | Method and apparatus for testing digital to analog and analog to digital converters | Naveena Nagi | 1997-08-19 |
| 5349587 | Multiple clock rate test apparatus for testing digital systems | Benoit Nadeau-Dostie, Abu Hassan, Dwayne Burek | 1994-09-20 |