Issued Patents All Time
Showing 26–50 of 83 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9003248 | Fault-driven scan chain configuration for test-per-clock | Janusz Rajski, Jedrzej Solecki, Grzegorz Mrugalski | 2015-04-07 |
| 8914694 | On-chip comparison and response collection tools and techniques | Nilanjan Mukherjee, Janusz Rajski | 2014-12-16 |
| 8832512 | Low power compression of incompatible test cubes | Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Przemyslaw Szczerbicki | 2014-09-09 |
| 8726113 | Selective per-cycle masking of scan chains for system level test | Janusz Rajski, Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee | 2014-05-13 |
| 8683280 | Test generator for low power built-in self-test | Janusz Rajski, Grzegorz Mrugalski, Benoit Nadeau-Dostie | 2014-03-25 |
| 8533547 | Continuous application and decompression of test patterns and selective compaction of test responses | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2013-09-10 |
| 8418007 | On-chip comparison and response collection tools and techniques | Nilanjan Mukherjee, Janusz Rajski | 2013-04-09 |
| 8356222 | Fault diagnosis for non-volatile memories | Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski | 2013-01-15 |
| 8347159 | Compression based on deterministic vector clustering of incompatible test cubes | Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Dariusz Czysz | 2013-01-01 |
| 8301945 | Decompressors for low power decompression of test patterns | Janusz Rajski, Grzegorz Mrugalski, Dariusz Czysz | 2012-10-30 |
| 8290738 | Low power scan testing techniques and apparatus | Xijiang Lin, Dariusz Czysz, Mark Kassab, Grzegorz Mrugalski, Janusz Rajski | 2012-10-16 |
| 8166359 | Selective per-cycle masking of scan chains for system level test | Janusz Rajski, Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee | 2012-04-24 |
| 8108743 | Method and apparatus for selectively compacting test responses | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2012-01-31 |
| 8046653 | Low power decompression of test cubes | Janusz Rajski, Grzegorz Mrugalski, Dariusz Czysz | 2011-10-25 |
| 8024387 | Method for synthesizing linear finite state machines | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2011-09-20 |
| 8015461 | Decompressors for low power decompression of test patterns | Janusz Rajski, Grzegorz Mrugalski, Dariusz Czysz | 2011-09-06 |
| 7962820 | Fault diagnosis of compressed test responses | Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Chen Wang | 2011-06-14 |
| 7925465 | Low power scan testing techniques and apparatus | Xijiang Lin, Dariusz Czysz, Mark Kassab, Grzegorz Mrugalski, Janusz Rajski | 2011-04-12 |
| 7913137 | On-chip comparison and response collection tools and techniques | Nilanjan Mukherjee, Janusz Rajski | 2011-03-22 |
| 7900104 | Test pattern compression for an integrated circuit test environment | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2011-03-01 |
| 7890827 | Compressing test responses using a compactor | Janusz Rajski, Chen Wang, Grzegorz Mrugalski, Artur Pogiel | 2011-02-15 |
| 7877656 | Continuous application and decompression of test patterns to a circuit-under-test | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2011-01-25 |
| 7865794 | Decompressor/PRPG for applying pseudo-random and deterministic test patterns | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2011-01-04 |
| 7818644 | Multi-stage test response compactors | Janusz Rajski, Grzegorz Mrugalski, Mark Kassab, Wu-Tung Cheng | 2010-10-19 |
| 7805649 | Method and apparatus for selectively compacting test responses | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2010-09-28 |