Issued Patents All Time
Showing 26–50 of 59 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8533547 | Continuous application and decompression of test patterns and selective compaction of test responses | Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee | 2013-09-10 |
| 8499209 | At-speed scan testing with controlled switching activity | Janusz Rajski, Elham K. Moghaddam, Nilanjan Mukherjee, Xijiang Lin | 2013-07-30 |
| 8290738 | Low power scan testing techniques and apparatus | Xijiang Lin, Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer | 2012-10-16 |
| 8108743 | Method and apparatus for selectively compacting test responses | Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee | 2012-01-31 |
| 8051352 | Timing-aware test generation and fault simulation | Xijiang Lin, Kun-Han Tsai, Chen Wang, Janusz Rajski | 2011-11-01 |
| 8024387 | Method for synthesizing linear finite state machines | Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee | 2011-09-20 |
| 7984354 | Generating responses to patterns stimulating an electronic circuit with timing exception paths | Dhiraj Goswami, Kun-Han Tsai, Janusz Rajski | 2011-07-19 |
| 7925465 | Low power scan testing techniques and apparatus | Xijiang Lin, Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer | 2011-04-12 |
| 7900104 | Test pattern compression for an integrated circuit test environment | Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer | 2011-03-01 |
| 7877656 | Continuous application and decompression of test patterns to a circuit-under-test | Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer | 2011-01-25 |
| 7865794 | Decompressor/PRPG for applying pseudo-random and deterministic test patterns | Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee | 2011-01-04 |
| 7818644 | Multi-stage test response compactors | Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng | 2010-10-19 |
| 7805649 | Method and apparatus for selectively compacting test responses | Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer | 2010-09-28 |
| 7765450 | Methods for distribution of test generation programs | Jon Udell, Chen Wang, Janusz Rajski | 2010-07-27 |
| 7669101 | Methods for distributing programs for generating test data | Jon Udell, Chen Wang, Janusz Rajski | 2010-02-23 |
| 7555689 | Generating responses to patterns stimulating an electronic circuit with timing exception paths | Dhiraj Goswami, Kun-Han Tsai, Janusz Rajski | 2009-06-30 |
| 7509546 | Test pattern compression for an integrated circuit test environment | Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer | 2009-03-24 |
| 7506232 | Decompressor/PRPG for applying pseudo-random and deterministic test patterns | Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee | 2009-03-17 |
| 7500163 | Method and apparatus for selectively compacting test responses | Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer | 2009-03-03 |
| 7493540 | Continuous application and decompression of test patterns to a circuit-under-test | Jansuz Rajski, Jerzy Tyszer, Nilanjan Mukherjee | 2009-02-17 |
| 7478296 | Continuous application and decompression of test patterns to a circuit-under-test | Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer | 2009-01-13 |
| 7386778 | Methods for distributing programs for generating test data | Jon Udell, Chen Wang, Janusz Rajski | 2008-06-10 |
| 7260591 | Method for synthesizing linear finite state machines | Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee | 2007-08-21 |
| 7111209 | Test pattern compression for an integrated circuit test environment | Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer | 2006-09-19 |
| 7093175 | Decompressor/PRPG for applying pseudo-random and deterministic test patterns | Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee | 2006-08-15 |