| 8533547 |
Continuous application and decompression of test patterns and selective compaction of test responses |
Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee |
2013-09-10 |
$3,998,000 |
| 8499209 |
At-speed scan testing with controlled switching activity |
Janusz Rajski, Elham K. Moghaddam, Nilanjan Mukherjee, Xijiang Lin |
2013-07-30 |
$5,717,000 |
| 8290738 |
Low power scan testing techniques and apparatus |
Xijiang Lin, Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer |
2012-10-16 |
$11,860,000 |
| 8108743 |
Method and apparatus for selectively compacting test responses |
Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee |
2012-01-31 |
$3,168,000 |
| 8051352 |
Timing-aware test generation and fault simulation |
Xijiang Lin, Kun-Han Tsai, Chen Wang, Janusz Rajski |
2011-11-01 |
$4,434,000 |
| 8024387 |
Method for synthesizing linear finite state machines |
Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee |
2011-09-20 |
$2,439,000 |
| 7984354 |
Generating responses to patterns stimulating an electronic circuit with timing exception paths |
Dhiraj Goswami, Kun-Han Tsai, Janusz Rajski |
2011-07-19 |
$3,721,000 |
| 7925465 |
Low power scan testing techniques and apparatus |
Xijiang Lin, Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer |
2011-04-12 |
$3,200,000 |
| 7900104 |
Test pattern compression for an integrated circuit test environment |
Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer |
2011-03-01 |
$11,452,000 |
| 7877656 |
Continuous application and decompression of test patterns to a circuit-under-test |
Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer |
2011-01-25 |
$8,734,000 |
| 7865794 |
Decompressor/PRPG for applying pseudo-random and deterministic test patterns |
Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee |
2011-01-04 |
$2,064,000 |
| 7818644 |
Multi-stage test response compactors |
Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng |
2010-10-19 |
|
| 7805649 |
Method and apparatus for selectively compacting test responses |
Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer |
2010-09-28 |
$2,751,000 |
| 7765450 |
Methods for distribution of test generation programs |
Jon Udell, Chen Wang, Janusz Rajski |
2010-07-27 |
|
| 7669101 |
Methods for distributing programs for generating test data |
Jon Udell, Chen Wang, Janusz Rajski |
2010-02-23 |
|
| 7555689 |
Generating responses to patterns stimulating an electronic circuit with timing exception paths |
Dhiraj Goswami, Kun-Han Tsai, Janusz Rajski |
2009-06-30 |
|
| 7509546 |
Test pattern compression for an integrated circuit test environment |
Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer |
2009-03-24 |
|
| 7506232 |
Decompressor/PRPG for applying pseudo-random and deterministic test patterns |
Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee |
2009-03-17 |
|
| 7500163 |
Method and apparatus for selectively compacting test responses |
Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer |
2009-03-03 |
|
| 7493540 |
Continuous application and decompression of test patterns to a circuit-under-test |
Jansuz Rajski, Jerzy Tyszer, Nilanjan Mukherjee |
2009-02-17 |
|
| 7478296 |
Continuous application and decompression of test patterns to a circuit-under-test |
Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer |
2009-01-13 |
|
| 7386778 |
Methods for distributing programs for generating test data |
Jon Udell, Chen Wang, Janusz Rajski |
2008-06-10 |
|
| 7260591 |
Method for synthesizing linear finite state machines |
Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee |
2007-08-21 |
|
| 7111209 |
Test pattern compression for an integrated circuit test environment |
Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer |
2006-09-19 |
|
| 7093175 |
Decompressor/PRPG for applying pseudo-random and deterministic test patterns |
Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee |
2006-08-15 |
|
