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Home › Continuous application and decompression of test patterns to a circuit-under-test

Continuous application and decompression of test patterns to a circuit-under-test

US Patent 7877656 · Granted Jan 25, 2011

Estimated economic value: $8,734,000 ⓘ

Assignee

Mentor Graphics

Inventors

Janusz Rajski (131 patents)
Mark Kassab (59 patents)
Nilanjan Mukherjee (92 patents)
Jerzy Tyszer (83 patents)

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