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Home › Low power scan testing techniques and apparatus

Low power scan testing techniques and apparatus

US Patent 7925465 · Granted Apr 12, 2011

Estimated economic value: $3,200,000 ⓘ

Assignee

Mentor Graphics

Inventors

Xijiang Lin (20 patents)
Dariusz Czysz (13 patents)
Mark Kassab (59 patents)
Grzegorz Mrugalski (38 patents)
Janusz Rajski (131 patents)
Jerzy Tyszer (83 patents)

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