Issued Patents All Time
Showing 76–100 of 131 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7900104 | Test pattern compression for an integrated circuit test environment | Mark Kassab, Nilanjan Mukherjee, Jerzy Tyszer | 2011-03-01 |
| 7890827 | Compressing test responses using a compactor | Jerzy Tyszer, Chen Wang, Grzegorz Mrugalski, Artur Pogiel | 2011-02-15 |
| 7877656 | Continuous application and decompression of test patterns to a circuit-under-test | Mark Kassab, Nilanjan Mukherjee, Jerzy Tyszer | 2011-01-25 |
| 7865792 | Test generation methods for reducing power dissipation and supply currents | Xijiang Lin | 2011-01-04 |
| 7865794 | Decompressor/PRPG for applying pseudo-random and deterministic test patterns | Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee | 2011-01-04 |
| 7840862 | Enhanced diagnosis with limited failure cycles | Yu Huang, Wu-Tung Cheng, Nagesh Tamarapalli, Randy Klingenberg | 2010-11-23 |
| 7818644 | Multi-stage test response compactors | Jerzy Tyszer, Grzegorz Mrugalski, Mark Kassab, Wu-Tung Cheng | 2010-10-19 |
| 7805651 | Phase shifter with reduced linear dependency | Jerzy Tyszer, Nagesh Tamarapalli | 2010-09-28 |
| 7805649 | Method and apparatus for selectively compacting test responses | Mark Kassab, Nilanjan Mukherjee, Jerzy Tyszer | 2010-09-28 |
| 7797603 | Low power decompression of test cubes | Grzegorz Mrugalski, Dariusz Czysz, Jerzy Tyszer | 2010-09-14 |
| 7765450 | Methods for distribution of test generation programs | Jon Udell, Chen Wang, Mark Kassab | 2010-07-27 |
| 7743302 | Compressing test responses using a compactor | Jerzy Tyszer, Chen Wang, Grzegorz Mrugalski, Artur Pogiel | 2010-06-22 |
| 7729884 | Compactor independent direct diagnosis of test hardware | Yu Huang, Wu-Tung Cheng | 2010-06-01 |
| 7685491 | Test generation methods for reducing power dissipation and supply currents | Xijiang Lin | 2010-03-23 |
| 7669101 | Methods for distributing programs for generating test data | Jon Udell, Chen Wang, Mark Kassab | 2010-02-23 |
| 7653851 | Phase shifter with reduced linear dependency | Jerzy Tyszer, Nagesh Tamarapalli | 2010-01-26 |
| 7647540 | Decompressors for low power decompression of test patterns | Grzegorz Mrugalski, Dariusz Czysz, Jerzy Tyszer | 2010-01-12 |
| 7555689 | Generating responses to patterns stimulating an electronic circuit with timing exception paths | Dhiraj Goswami, Kun-Han Tsai, Mark Kassab | 2009-06-30 |
| 7523372 | Phase shifter with reduced linear dependency | Jerzy Tyszer, Nagesh Tamarapalli | 2009-04-21 |
| 7512508 | Determining and analyzing integrated circuit yield and quality | Gang Chen, Martin Keim, Nagesh Tamarapalli, Manish Sharma, Huaxing Tang | 2009-03-31 |
| 7509600 | Generating test patterns having enhanced coverage of untargeted defects | Huaxing Tang, Chen Wang | 2009-03-24 |
| 7509546 | Test pattern compression for an integrated circuit test environment | Mark Kassab, Nilanjan Mukherjee, Jerzy Tyszer | 2009-03-24 |
| 7509550 | Fault diagnosis of compressed test responses | Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer, Chen Wang | 2009-03-24 |
| 7506232 | Decompressor/PRPG for applying pseudo-random and deterministic test patterns | Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee | 2009-03-17 |
| 7500163 | Method and apparatus for selectively compacting test responses | Mark Kassab, Nilanjan Mukherjee, Jerzy Tyszer | 2009-03-03 |