Issued Patents All Time
Showing 101–125 of 131 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7478296 | Continuous application and decompression of test patterns to a circuit-under-test | Mark Kassab, Nilanjan Mukherjee, Jerzy Tyszer | 2009-01-13 |
| 7437640 | Fault diagnosis of compressed test responses having one or more unknown states | Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer, Chen Wang | 2008-10-14 |
| 7437636 | Method and apparatus for at-speed testing of digital circuits | Abu Hassan, Robert L. Thompson, Nagesh Tamarapalli | 2008-10-14 |
| 7386778 | Methods for distributing programs for generating test data | Jon Udell, Chen Wang, Mark Kassab | 2008-06-10 |
| 7370254 | Compressing test responses using a compactor | Jerzy Tyszer, Chen Wang, Grzegorz Mrugalski, Artur Pogiel | 2008-05-06 |
| 7302624 | Adaptive fault diagnosis of compressed test responses | Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer, Chen Wang | 2007-11-27 |
| 7263641 | Phase shifter with reduced linear dependency | Jerzy Tyszer, Nagesh Tamarapalli | 2007-08-28 |
| 7260591 | Method for synthesizing linear finite state machines | Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee | 2007-08-21 |
| 7239978 | Compactor independent fault diagnosis | Wu-Tung Cheng, Kun-Han Tsai, Yu Huang, Nagesh Tamarapalli | 2007-07-03 |
| 7111209 | Test pattern compression for an integrated circuit test environment | Mark Kassab, Nilanjan Mukherjee, Jerzy Tyszer | 2006-09-19 |
| 7093175 | Decompressor/PRPG for applying pseudo-random and deterministic test patterns | Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee | 2006-08-15 |
| 6966021 | Method and apparatus for at-speed testing of digital circuits | Abu Hassan, Robert L. Thompson, Nagesh Tamarapalli | 2005-11-15 |
| 6954888 | Arithmetic built-in self-test of multiple scan-based integrated circuits | Jerzy Tyszer | 2005-10-11 |
| 6874109 | Phase shifter with reduced linear dependency | Jerzy Tyszer, Nagesh Tamarapalli | 2005-03-29 |
| 6829740 | Method and apparatus for selectively compacting test responses | Mark Kassab, Nilanjan Mukherjee, Jerzy Tyszer | 2004-12-07 |
| 6728901 | Arithmetic built-in self-test of multiple scan-based integrated circuits | Jerzy Tyszer | 2004-04-27 |
| 6708192 | Method for synthesizing linear finite state machines | Mark Kassab, Nilanjan Mukherjee, Jerzy Tyszer | 2004-03-16 |
| 6684358 | Decompressor/PRPG for applying pseudo-random and deterministic test patterns | Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee | 2004-01-27 |
| 6662327 | Method for clustered test pattern generation | — | 2003-12-09 |
| 6557129 | Method and apparatus for selectively compacting test responses | Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee | 2003-04-29 |
| 6543020 | Test pattern compression for an integrated circuit test environment | Mark Kassab, Nilanjan Mukherjee, Jerzy Tyszer | 2003-04-01 |
| 6539409 | Method for synthesizing linear finite state machines | Mark Kassab, Nilanjan Mukherjee, Jerzy Tyszer | 2003-03-25 |
| 6421794 | Method and apparatus for diagnosing memory using self-testing circuits | John Chen | 2002-07-16 |
| 6353842 | Method for synthesizing linear finite state machines | Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee | 2002-03-05 |
| 6327687 | Test pattern compression for an integrated circuit test environment | Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee | 2001-12-04 |