Issued Patents All Time
Showing 51–75 of 131 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8595574 | Enhanced diagnosis with limited failure cycles | Yu Huang, Wu-Tung Cheng, Nagesh Tamarapalli, Randy Klingenberg | 2013-11-26 |
| 8560906 | Timing-aware test generation and fault simulation | Xijiang Lin, Kun-Han Tsai, Mark Kassab, Chen Wang | 2013-10-15 |
| 8533547 | Continuous application and decompression of test patterns and selective compaction of test responses | Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee | 2013-09-10 |
| 8499209 | At-speed scan testing with controlled switching activity | Elham K. Moghaddam, Nilanjan Mukherjee, Mark Kassab, Xijiang Lin | 2013-07-30 |
| 8438438 | Enhanced diagnosis with limited failure cycles | Yu Huang, Wu-Tung Cheng, Nagesh Tamarapalli, Randy Klingenberg | 2013-05-07 |
| 8418007 | On-chip comparison and response collection tools and techniques | Nilanjan Mukherjee, Jerzy Tyszer | 2013-04-09 |
| 8356222 | Fault diagnosis for non-volatile memories | Nilanjan Mukherjee, Artur Pogiel, Jerzy Tyszer | 2013-01-15 |
| 8347159 | Compression based on deterministic vector clustering of incompatible test cubes | Grzegorz Mrugalski, Nilanjan Mukherjee, Dariusz Czysz, Jerzy Tyszer | 2013-01-01 |
| 8301414 | Compactor independent fault diagnosis | Wu-Tung Cheng, Kun-Han Tsai, Yu Huang, Nagesh Tamarapalli | 2012-10-30 |
| 8301945 | Decompressors for low power decompression of test patterns | Grzegorz Mrugalski, Dariusz Czysz, Jerzy Tyszer | 2012-10-30 |
| 8290738 | Low power scan testing techniques and apparatus | Xijiang Lin, Dariusz Czysz, Mark Kassab, Grzegorz Mrugalski, Jerzy Tyszer | 2012-10-16 |
| 8280688 | Compactor independent direct diagnosis of test hardware | Yu Huang, Wu-Tung Cheng | 2012-10-02 |
| 8201131 | Generating test patterns having enhanced coverage of untargeted defects | Huaxing Tang, Chen Wang | 2012-06-12 |
| 8166359 | Selective per-cycle masking of scan chains for system level test | Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Jerzy Tyszer | 2012-04-24 |
| 8161338 | Modular compaction of test responses | Wojciech Rajski | 2012-04-17 |
| 8108743 | Method and apparatus for selectively compacting test responses | Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee | 2012-01-31 |
| 8051352 | Timing-aware test generation and fault simulation | Xijiang Lin, Kun-Han Tsai, Mark Kassab, Chen Wang | 2011-11-01 |
| 8046653 | Low power decompression of test cubes | Grzegorz Mrugalski, Dariusz Czysz, Jerzy Tyszer | 2011-10-25 |
| 8024387 | Method for synthesizing linear finite state machines | Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee | 2011-09-20 |
| 8015461 | Decompressors for low power decompression of test patterns | Grzegorz Mrugalski, Dariusz Czysz, Jerzy Tyszer | 2011-09-06 |
| 7987442 | Fault dictionaries for integrated circuit yield and quality analysis methods and systems | Gang Chen, Martin Keim, Nagesh Tamarapalli, Manish Sharma, Huaxing Tang | 2011-07-26 |
| 7984354 | Generating responses to patterns stimulating an electronic circuit with timing exception paths | Dhiraj Goswami, Kun-Han Tsai, Mark Kassab | 2011-07-19 |
| 7962820 | Fault diagnosis of compressed test responses | Grzegorz Mrugalski, Artur Pogiel, Jerzy Tyszer, Chen Wang | 2011-06-14 |
| 7925465 | Low power scan testing techniques and apparatus | Xijiang Lin, Dariusz Czysz, Mark Kassab, Grzegorz Mrugalski, Jerzy Tyszer | 2011-04-12 |
| 7913137 | On-chip comparison and response collection tools and techniques | Nilanjan Mukherjee, Jerzy Tyszer | 2011-03-22 |