Issued Patents All Time
Showing 126–131 of 131 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6070261 | Multi-phase test point insertion for built-in self test of integrated circuits | Nagesh Tamarapalli | 2000-05-30 |
| 5991898 | Arithmetic built-in self test of multiple scan-based integrated circuits | Jerzy Tyszer | 1999-11-23 |
| 5991909 | Parallel decompressor and related methods and apparatuses | Jerzy Tyszer | 1999-11-23 |
| 5737340 | Multi-phase test point insertion for built-in self test of integrated circuits | Nagesh Tamarapalli | 1998-04-07 |
| 5528604 | Test pattern generation for an electronic circuit using a transformed circuit description | Aiman Helmi El-Maleh, Wojciech P. Maly, Thomas E. Marchok | 1996-06-18 |
| 5313469 | Self-testable digital integrator | Saman M. I. Adham, Jerzy Tyszer, Mark Kassab | 1994-05-17 |