Issued Patents All Time
Showing 1–25 of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12400725 | Conducting built-in self-test of memory macro | Marat Gershoig, Vineet Joshi, Ted Wong | 2025-08-26 |
| 12385973 | Scan architecture for interconnect testing in 3D integrated circuits | Sandeep Kumar Goel, Yun-Han Lee, Marat Gershoig | 2025-08-12 |
| 12381747 | Authentication based on physically unclonable functions | Robert Abbott, Peter Noel | 2025-08-05 |
| 12244741 | Physical unclonable function (PUF) security key generation | Shih-Lien Linus Lu, Peter Noel | 2025-03-04 |
| 12184795 | PUF method and structure | Shih-Lien Linus Lu, Yu-Der Chih | 2024-12-31 |
| 12135608 | Memory address protection circuit including an error detection circuit and method of operating same | Ramin SHARIAT-YAZDI, Shih-Lien Linus Lu | 2024-11-05 |
| 12033710 | System and method for conducting built-in self-test of memory macro | Ted Wong, Marat Gershoig | 2024-07-09 |
| 11899064 | Scan architecture for interconnect testing in 3D integrated circuits | Sandeep Kumar Goel, Yun-Han Lee, Marat Gershoig | 2024-02-13 |
| 11856115 | Physical unclonable function (PUF) security key generation | Shih-Lien Linus Lu, Peter Noel | 2023-12-26 |
| 11823758 | Conducting built-in self-test of memory macro | Ted Wong, Marat Gershoig, Vineet Joshi | 2023-11-21 |
| 11777747 | Authentication based on physically unclonable functions | Robert Abbott, Peter Noel | 2023-10-03 |
| 11734142 | Scan synchronous-write-through testing architectures for a memory device | Ming-Hung Chang, Atul Katoch, Chia-En Huang, Ching-Wei Wu, Donald George Mikan, Jr. +5 more | 2023-08-22 |
| 11714705 | Memory address protection circuit and method of operating same | Ramin SHARIAT-YAZDI, Shih-Lien Linus Lu | 2023-08-01 |
| 11549984 | Scan architecture for interconnect testing in 3D integrated circuits | Sandeep Kumar Goel, Yun-Han Lee, Marat Gershoig | 2023-01-10 |
| 11379298 | Memory address protection circuit and method | Ramin SHARIAT-YAZDI, Shih-Lien Linus Lu | 2022-07-05 |
| 11256588 | Scan synchronous-write-through testing architectures for a memory device | Ming-Hung Chang, Atul Katoch, Chia-En Huang, Ching-Wei Wu, Donald George Mikan, Jr. +5 more | 2022-02-22 |
| 11210165 | Inter-hamming difference analyzer for memory array and measuring and testing methods for inter-hamming differences of memory array | Shih-Lien Linus Lu, Kun-Hsi Li | 2021-12-28 |
| 11050574 | Authentication based on physically unclonable functions | Robert Abbott, Peter Noel | 2021-06-29 |
| 10965475 | Physical unclonable function (PUF) security key generation | Shih-Lien Linus Lu, Peter Noel | 2021-03-30 |
| 10838809 | Memory array and measuring and testing methods for inter-hamming differences of memory array | Shih-Lien Linus Lu, Kun-Hsi Li | 2020-11-17 |
| 10740174 | Memory address protection circuit and method | Ramin SHARIAT-YAZDI, Shih-Lien Linus Lu | 2020-08-11 |
| 10705934 | Scan synchronous-write-through testing architectures for a memory device | Ming-Hung Chang, Atul Katoch, Chia-En Huang, Ching-Wei Wu, Donald George Mikan, Jr. +5 more | 2020-07-07 |
| 10539617 | Scan architecture for interconnect testing in 3D integrated circuits | Sandeep Kumar Goel, Yun-Han Lee, Marat Gershoig | 2020-01-21 |
| 10515710 | Hamming-distance analyzer | Shih-Lien Linus Lu, Kun-Hsi Li | 2019-12-24 |
| 10511451 | Physically unclonable function (PUF) device and method of extending challenge/response pairs in a PUF device | Shih-Lien Linus Lu | 2019-12-17 |