SA

Saman M. I. Adham

TSMC: 38 patents #895 of 12,232Top 8%
LO Logicvision: 2 patents #10 of 30Top 35%
Nortel Networks Limited: 2 patents #1,531 of 5,294Top 30%
📍 Carp, CA: #22 of 291 inventorsTop 8%
Overall (All Time): #71,814 of 4,157,543Top 2%
42
Patents All Time

Issued Patents All Time

Showing 26–42 of 42 patents

Patent #TitleCo-InventorsDate
10382060 On-line self-checking hamming encoder, decoder and associated method Ramin Yazdi, Arshak Arshakyan 2019-08-13
10372532 Memory array and measuring and testing methods for inter-hamming differences of memory array Shih-Lien Linus Lu, Kun-Hsi Li 2019-08-06
9835680 Method, device and computer program product for circuit testing Sandeep Kumar Goel, Yun-Han Lee 2017-12-05
9625523 Method and apparatus for interconnect test Sandeep Kumar Goel 2017-04-18
9367662 Fault injection of finFET devices Atul Katoch, Cormac Michael O'Connell 2016-06-14
9341672 Method and apparatus for interconnect test Sandeep Kumar Goel 2016-05-17
9269459 Mechanisms for built-in self test and repair for memory devices Chao-Jung Hung 2016-02-23
8959468 Fault injection of finFET devices Atul Katoch, Cormac Michael O'Connell 2015-02-17
8942051 Mechanisms for built-in self test and repair for memory devices Chao-Jung Hung 2015-01-27
8873318 Mechanisms for built-in self repair of memory devices using failed bit maps and obvious repairs Volodymyr Shvydun 2014-10-28
8760949 Mechanisms for built-in self repair of memory devices using failed bit maps and obvious repairs Volodymyr Shvydun 2014-06-24
8605527 Mechanisms for built-in self test and repair for memory devices Volodymyr Shvydun 2013-12-10
8509014 Mechanisms for built-in self repair of memory devices using failed bit maps and obvious repairs Volodymyr Shvydun 2013-08-13
7257733 Memory repair circuit and method Benoit Nadeau-Dostie 2007-08-14
7139946 Method and test circuit for testing memory internal write enable Benoit Nadeau-Dostie 2006-11-21
5668817 Self-testable digital signal processor and method for self-testing of integrating circuits including DSP data paths 1997-09-16
5313469 Self-testable digital integrator Janusz Rajski, Jerzy Tyszer, Mark Kassab 1994-05-17