Issued Patents All Time
Showing 1–25 of 35 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12394586 | Charged particle beam device | Momoyo Enyama, Hajime Kawano, Makoto Suzuki, Kenji Tanimoto, Yuko Sasaki | 2025-08-19 |
| 12205790 | Charged particle beam device | Momoyo Enyama, Hajime Kawano, Hiroya Ohta | 2025-01-21 |
| 12196802 | Semiconductor inspection device and method for inspecting semiconductor sample | Yasuhiro Shirasaki, Natsuki Tsuno, Minami Shouji, Satoshi Takada | 2025-01-14 |
| 12176181 | Pattern inspecting device | Wei Sun, Yasunori Goto, Takuma Yamamoto | 2024-12-24 |
| 12125667 | Charged particle beam device | Yasuhiro Shirasaki, Momoyo Enyama, Hajime Kawano, Akira Ikegami | 2024-10-22 |
| 12057288 | Charged particle beam device and inspection method | Momoyo Enyama, Hajime Kawano | 2024-08-06 |
| 11967482 | Charged particle beam device | Wen Li, Hajime Kawano, Momoyo Enyama | 2024-04-23 |
| 11791130 | Electron beam observation device, electron beam observation system, and image correcting method and method for calculating correction factor for image correction in electron beam observation device | Koichi Hamada, Megumi Kimura, Momoyo Enyama, Ryou YUMIBA, Kei Sakai +4 more | 2023-10-17 |
| 11685705 | Method for producing α-allylated cycloalkanone | Jun Deguchi, Daichi Sakoda | 2023-06-27 |
| 11524929 | Method for producing alpha-allylated cycloalkanone | Jun Deguchi, Daichi Sakoda | 2022-12-13 |
| 11518110 | Adhesive application apparatus | Hiroyuki Ueno | 2022-12-06 |
| 11380518 | Measurement system and method for setting observation conditions of measurement apparatus | Takafumi Miwa, Hirokazu Tamaki, Momoyo Enyama, Sayaka KURATA, Atsuko Shintani +6 more | 2022-07-05 |
| 11282671 | Charged-particle beam apparatus | Uki Ikeda, Daisuke Bizen, Makoto Suzuki | 2022-03-22 |
| 11257658 | Charged particle beam apparatus | Noritsugu Takahashi, Makoto Suzuki, Minoru Yamazaki | 2022-02-22 |
| 11227740 | Electron gun and electron beam application device | Soichiro Matsunaga, Yasunari Sohda, Souichi Katagiri, Hajime Kawano, Takashi Doi | 2022-01-18 |
| 11170969 | Electron beam observation device, electron beam observation system, and control method of electron beam observation device | Koichi Hamada, Megumi Kimura, Momoyo Enyama, Ryou YUMIBA, Kei Sakai +2 more | 2021-11-09 |
| 11011348 | Scanning electron microscope and sample observation method using scanning electron microscope | Daisuke Bizen, Natsuki Tsuno, Takafumi Miwa, Toshiyuki Yokosuka, Hideyuki Kazumi | 2021-05-18 |
| 10825649 | Electron beam device | Yasunari Sohda, Daisuke Bizen | 2020-11-03 |
| 10755396 | Image forming apparatus | Momoyo Enyama, Yasuhiro Shirasaki, Michio Hatano | 2020-08-25 |
| 10707047 | Measuring device and measuring method | Noritsugu Takahashi, Wataru MORI, Hajime Kawano, Yuko Sasaki | 2020-07-07 |
| 10636618 | Charged particle beam apparatus | Kaori Bizen, Yasunari Sohda, Hiroya Ohta, Kenji Tanimoto, Yusuke Abe | 2020-04-28 |
| 10361063 | Charged particle detector and charged particle beam device using the same | Yasuhiro Shirasaki, Momoyo Enyama, Kaori Shirahata | 2019-07-23 |
| 10319562 | Charged particle beam device | Megumi Kimura, Momoyo Enyama | 2019-06-11 |
| 10217604 | Charged particle beam apparatus | Hajime Kawano, Makoto Suzuki, Yuji Kasai, Daisuke Bizen, Yoshinori Momonoi | 2019-02-26 |
| 10184595 | Duct and method of manufacturing the same | Masahito Yabuoshi, Kengo Nakamura, Shinji Yamamoto, Hiromi Nakano | 2019-01-22 |