Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11783470 | Design-assisted inspection for DRAM and 3D NAND devices | Hucheng Lee, Sangbong Park, Xiaochun Li | 2023-10-10 |
| 11308606 | Design-assisted inspection for DRAM and 3D NAND devices | Hucheng Lee, Sangbong Park, Xiaochun Li | 2022-04-19 |
| 11270430 | Wafer inspection using difference images | Abdurrahman Sezginer, Xiaochun Li, Pavan Kumar, Lisheng Gao, Grace Hsiu-Ling Chen +2 more | 2022-03-08 |
| 10923317 | Detecting defects in a logic region on a wafer | Paul Russell, Hucheng Lee, Kenong Wu | 2021-02-16 |
| 10605744 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, Mohan Mahadevan, James A. Smith, Lisheng Gao +2 more | 2020-03-31 |
| 10599944 | Visual feedback for inspection algorithms and filters | Hucheng Lee, Lisheng Gao | 2020-03-24 |
| 10600177 | Nuisance reduction using location-based attributes | Bjorn Brauer, Lisheng Gao | 2020-03-24 |
| 10395359 | Adaptive local threshold and color filtering | Hucheng Lee, Kenong Wu, Lisheng Gao | 2019-08-27 |
| 10339262 | System and method for defining care areas in repeating structures of design data | Soren Konecky, Hucheng Lee, Kenong Wu, Lisheng Gao | 2019-07-02 |
| 9880107 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, Mohan Mahadevan, James A. Smith, Lisheng Gao +2 more | 2018-01-30 |
| 9704234 | Adaptive local threshold and color filtering | Hucheng Lee, Kenong Wu, Lisheng Gao | 2017-07-11 |
| 9619876 | Detecting defects on wafers based on 2D scatter plots of values determined for output generated using different optics modes | Lisheng Gao | 2017-04-11 |
| 9442077 | Scratch filter for wafer inspection | Huan Jin, Grace Hsiu-Ling Chen, Lisheng Gao | 2016-09-13 |
| 9224660 | Tuning wafer inspection recipes using precise defect locations | Ashok Kulkarni, Lisheng Gao | 2015-12-29 |
| 9053527 | Detecting defects on a wafer | Jun Lang, Kan-Nan Chen, Lisheng Gao | 2015-06-09 |
| 8989479 | Region based virtual fourier filter | Lisheng Gao, Kenong Wu, Allen Park, Ellis Chang, Khurram Zafar +5 more | 2015-03-24 |
| 8775101 | Detecting defects on a wafer | Yong Zhang, Stephanie Chen, Tao Luo, Lisheng Gao, Richard Wallingford | 2014-07-08 |
| 8467047 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, Mohan Mahadevan, James A. Smith, Lisheng Gao +2 more | 2013-06-18 |
| 8223327 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, Mohan Mahadevan, James A. Smith, Lisheng Gao +2 more | 2012-07-17 |
| 8059886 | Adaptive signature detection | Yong Gao, Lisheng Gao | 2011-11-15 |