Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360461 | Identification of hot spots or defects by machine learning | Jing Su, Yi Zou, Stefan Hunsche, Marinus Jochemsen, Yen-Wen Lu +1 more | 2025-07-15 |
| 12055904 | Method to predict yield of a device manufacturing process | Youping Zhang, Boris Menchtchikov, Cyrus E. Tabery, Yi Zou, Yana Cheng +2 more | 2024-08-06 |
| 12044980 | Method of manufacturing devices | Abraham SLACHTER, Wim Tjibbo Tel, Daan Maurits Slotboom, Vadim Yourievich TIMOSHKOV, Koen Wilhelmus Cornelis Adrianus Van Der Straten +7 more | 2024-07-23 |
| 12045555 | Method to label substrates based on process parameters | Vahid BASTANI, Alexander Ypma, Dag Sonntag, Everhardus Cornelis Mos, Hakki Ergün Cekli | 2024-07-23 |
| 11947266 | Method for controlling a manufacturing process and associated apparatuses | Nicolaas Petrus Marcus Brantjes, Matthijs Cox, Boris Menchtchikov, Cyrus E. Tabery, Youping Zhang +4 more | 2024-04-02 |
| 11803127 | Method for determining root cause affecting yield in a semiconductor manufacturing process | Cyrus E. Tabery, Hakki Ergün Cekli, Simon Philip Spencer Hastings, Boris Menchtchikov, Yi Zou +5 more | 2023-10-31 |
| 11754931 | Method for determining corrections for lithographic apparatus | Roy Werkman, David Deckers, Simon Philip Spencer Hastings, Jeffrey Thomas Ziebarth, Samee Ur Rehman +2 more | 2023-09-12 |
| 11714357 | Method to predict yield of a device manufacturing process | Alexander Ypma, Cyrus E. Tabery, Simon Hendrik Celine Van Gorp, Dag Sonntag, Hakki Ergün Cekli +9 more | 2023-08-01 |
| 11443083 | Identification of hot spots or defects by machine learning | Jing Su, Yi Zou, Stefan Hunsche, Marinus Jochemsen, Yen-Wen Lu +1 more | 2022-09-13 |
| 11181829 | Method for determining a control parameter for an apparatus utilized in a semiconductor manufacturing process | Cyrus E. Tabery, Hakki Ergün Cekli, Simon Hendrik Celine Van Gorp | 2021-11-23 |
| 11183434 | Methods of guiding process models and inspection in a manufacturing process | Yu Cao, Yi Zou | 2021-11-23 |
| 11086229 | Method to predict yield of a device manufacturing process | Alexander Ypma, Cyrus E. Tabery, Simon Hendrik Celine Van Gorp, Dag Sonntag, Hakki Ergün Cekli +9 more | 2021-08-10 |
| 9300134 | Methods and systems for power restoration planning | Xiaosong Yang | 2016-03-29 |
| 8738467 | Cluster-based scalable collaborative filtering | Gui-Rong Xue, Hua-Jun Zeng, Zheng Chen, Benyu Zhang, Jian Wang | 2014-05-27 |
| 7925644 | Efficient retrieval algorithm by query term discrimination | Lei Ji, Huajun Zeng, Benyu Zhang, Zheng Chen, Jian Wang | 2011-04-12 |
| 7844449 | Scalable probabilistic latent semantic analysis | Jie Han, GuiRong Xue, Hua-Jun Zeng, Benyu Zhang, Zheng Chen +1 more | 2010-11-30 |
| 7822752 | Efficient retrieval algorithm by query term discrimination | Lei Ji, Huajun Zeng, Benyu Zhang, Zheng Chen, Jian Wang | 2010-10-26 |
| 7818330 | Block tracking mechanism for web personalization | Min-Sheng Wu, Benyu Zhang, Huajun Zeng, Zheng Chen, Jian Wang | 2010-10-19 |
| 7711735 | User segment suggestion for online advertising | Min-Sheng Wu, Benyu Zhang, Zheng Chen, Jian Wang | 2010-05-04 |
| 7634471 | Adaptive grouping in a file network | Zheng Chen, Lei Li, Qiaoling Liu, Jian Wang, Benyu Zhang | 2009-12-15 |
| 7624130 | System and method for exploring a semantic file network | Zheng Chen, Lei Li, Qiaoling Liu, Jian Wang, Benyu Zhang | 2009-11-24 |
| 7594013 | Creating home pages based on user-selected information of web pages | Jian Wang, Hua-Jun Zeng, Zheng Chen, Benyu Zhang, Bing Sun | 2009-09-22 |
| 7555480 | Comparatively crawling web page data records relative to a template | Benyu Zhang, Hua-Jun Zeng, Jian Wang, Ke Tang, Zheng Chen | 2009-06-30 |
| 7502785 | Extracting semantic attributes | Zheng Chen, Lei Li, Qiaoling Liu, Jian Wang, Benyu Zhang | 2009-03-10 |