Issued Patents All Time
Showing 51–75 of 130 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9657272 | Immortalization of epithelial cells and methods of use | Richard Schlegel | 2017-05-23 |
| 9448162 | Time-resolved single-photon or ultra-weak light multi-dimensional imaging spectrum system and method | Guangjie Zhai, Wenkai Yu, Xuri Yao, Chao Wang, Zhibin Sun | 2016-09-20 |
| 9448184 | Method and system for determining one or more optical characteristics of structure of a semiconductor wafer | Yung-Ho Alex Chuang, John Fielden | 2016-09-20 |
| 9404960 | On chip bias temperature instability characterization of a semiconductor device | Hanyi Ding, Alvin W. Strong, Randy L. Wolf | 2016-08-02 |
| 9310296 | Optimizing an optical parametric model for structural analysis using optical critical dimension (OCD) metrology | Thaddeus Gerard Dziura, Yung-Ho Alex Chuang, Bin-Ming Benjamin Tsai, John J. Hench | 2016-04-12 |
| 9304335 | Integrated LDMOS devices for silicon photonics | John J. Ellis-Monaghan, William M. Green, Michael J. Hauser, Edward W. Kiewra, Steven M. Shank | 2016-04-05 |
| 9291554 | Method of electromagnetic modeling of finite structures and finite illumination for metrology and inspection | Alexander Kuznetsov, Kevin Peterlinz, Andrei V. Shchegrov, Leonid Poslavsky | 2016-03-22 |
| 9279106 | Immortalization of epithelial cells and methods of use | Richard Schlegel | 2016-03-08 |
| 9087808 | Fabricating polysilicon MOS devices and passive ESD devices | John J. Ellis-Monaghan, Michael J. Hauser, Zhong-Xiang He, Junjun Li, Anthony K. Stamper | 2015-07-21 |
| 9087925 | Si and SiGeC on a buried oxide layer on a substrate | Robert M. Rassel, Steven H. Voldman | 2015-07-21 |
| 9080990 | Illumination subsystems of a metrology system, metrology systems, and methods for illuminating a specimen for metrology measurements | Yung-Ho Alex Chuang, Vladimir Levinski | 2015-07-14 |
| 9080991 | Illuminating a specimen for metrology or inspection | Yung-Ho Alex Chuang, Vladimir Levinski, John Fielden | 2015-07-14 |
| 9059183 | Structure of very high insertion loss of the substrate noise decoupling | Hanyi Ding, Kai D. Feng, Zhong-Xiang He | 2015-06-16 |
| 9059281 | Dual L-shaped drift regions in an LDMOS device and method of making the same | David G. Brochu, JR., John J. Ellis-Monaghan, Michael J. Hauser, Jeffrey B. Johnson | 2015-06-16 |
| 9059138 | Heterojunction bipolar transistor with reduced sub-collector length, method of manufacture and design structure | Renata Camillo-Castillo, Zhong-Xiang He, Jeffrey B. Johnson, Qizhi Liu | 2015-06-16 |
| 9054793 | Structure, system and method for device radio frequency (RF) reliability | Donald J. Cook, Hanyi Ding, Randy L. Wolf | 2015-06-09 |
| 8951893 | Fabricating polysilicon MOS devices and passive ESD devices | John J. Ellis-Monaghan, Michael J. Hauser, Zhong-Xiang He, Junjun Li, Anthony K. Stamper | 2015-02-10 |
| 8946013 | Lateral diffusion field effect transistor with drain region self-aligned to gate electrode | Natalie B. Feilchenfeld, Jeffrey P. Gambino, Benjamin T. Voegeli, Steven H. Voldman, Michael J. Zierak | 2015-02-03 |
| 8921172 | Junction field effect transistor structure with P-type silicon germanium or silicon germanium carbide gate(s) and method of forming the structure | Richard A. Phelps, Robert M. Rassel, Xiaowei Tian | 2014-12-30 |
| 8860937 | Metrology systems and methods for high aspect ratio and large lateral dimension structures | Thaddeus Gerard Dziura, David Y. Wang, Jonathan M. Madsen, Alexander Kuznetsov, Johannes D. de Veer +3 more | 2014-10-14 |
| 8860191 | On-chip transmission line structures with balanced phase delay | Hanyi Ding, Kai D. Feng, Zhong-Xiang He | 2014-10-14 |
| 8832611 | Process aware metrology | Yung-Ho Alex Chuang, John Fielden, Bin-Ming Benjamin Tsai, Jingjing Zhang | 2014-09-09 |
| 8809155 | Back-end-of-line metal-oxide-semiconductor varactors | John J. Ellis-Monaghan, Michael J. Hauser, Zhong-Xiang He, Richard A. Phelps, Robert M. Rassel +1 more | 2014-08-19 |
| 8779476 | Asymmetric wedge JFET, related method and design structure | Richard A. Phelps, Robert M. Rassel, Xiaowei Tian | 2014-07-15 |
| 8754455 | Junction field effect transistor structure with P-type silicon germanium or silicon germanium carbide gate(s) and method of forming the structure | Richard A. Phelps, Robert M. Rassel, Xiaowei Tian | 2014-06-17 |