PX

Peng Xu

IBM: 299 patents #74 of 70,183Top 1%
WE Westinghouse Electric: 23 patents #30 of 5,139Top 1%
TE Tessera: 9 patents #45 of 271Top 20%
ET Elpis Technologies: 6 patents #3 of 121Top 3%
AS Adeia Semiconductor Solutions: 3 patents #3 of 57Top 6%
Globalfoundries: 2 patents #1,397 of 4,424Top 35%
FU Fudan University: 2 patents #57 of 419Top 15%
EN Evolved By Nature: 2 patents #10 of 16Top 65%
NU Nanjing University: 1 patents #82 of 294Top 30%
DC Daye Special Steel Co.: 1 patents #5 of 38Top 15%
Dow Global Technologies: 1 patents #2,632 of 4,534Top 60%
FU Florida State University: 1 patents #294 of 597Top 50%
MIT: 1 patents #4,386 of 9,367Top 50%
Rohm And Haas: 1 patents #1,282 of 2,359Top 55%
VP Virginia Tech Intellectual Properties: 1 patents #405 of 1,095Top 40%
YT Yancheng Institute Of Technology: 1 patents #4 of 43Top 10%
📍 Columbia, SC: #1 of 1,151 inventorsTop 1%
🗺 South Carolina: #1 of 15,501 inventorsTop 1%
Overall (All Time): #827 of 4,157,543Top 1%
360
Patents All Time

Issued Patents All Time

Showing 126–150 of 360 patents

Patent #TitleCo-InventorsDate
10665511 Self-limiting liners for increasing contact trench volume in N-type and P-type transistors Kangguo Cheng, Choonghyun Lee, Juntao Li 2020-05-26
10665505 Self-aligned gate contact isolation Kangguo Cheng, Ekmini Anuja De Silva, Ruilong Xie 2020-05-26
10658473 Gate cut device fabrication with extended height gates Kangguo Cheng, Andrew M. Greene, John R. Sporre 2020-05-19
10651378 Resistive random-access memory Kangguo Cheng, Choonghyun Lee, Juntao Li 2020-05-12
10644108 Strained and unstrained semiconductor device features formed on the same substrate Kangguo Cheng, Juntao Li 2020-05-05
10636887 Self-limiting fin spike removal Kangguo Cheng, Choonghyun Lee, Juntao Li 2020-04-28
10636709 Semiconductor fins with dielectric isolation at fin bottom Kangguo Cheng, Jay William Strane 2020-04-28
10629589 Resistor fins Zhenxing Bi, Kangguo Cheng, Juntao Li 2020-04-21
10622208 Lateral semiconductor nanotube with hexagonal shape Juntao Li, Kangguo Cheng, Choonghyun Lee 2020-04-14
10608100 Unipolar spacer formation for finFETs Kangguo Cheng, Jie Yang 2020-03-31
10608096 Formation of air gap spacers for reducing parasitic capacitance Kangguo Cheng, Choonghyun Lee, Heng Wu 2020-03-31
10600889 Nanosheet transistors with thin inner spacers and tight pitch gate Kangguo Cheng, Choonghyun Lee, Juntao Li 2020-03-24
10593802 Forming a sacrificial liner for dual channel devices Huiming Bu, Kangguo Cheng, Dechao Guo, Sivananda K. Kanakasabapathy 2020-03-17
10586737 Method and structure for forming vertical transistors with shared gates and separate gates Zhenxing Bi, Kangguo Cheng, Juntao Li 2020-03-10
10573566 Fabrication of fin field effect transistor complementary metal-oxide-semiconductor devices with uniform hybrid channels Zhenxing Bi, Kangguo Cheng, Jie Yang 2020-02-25
10573561 Formation of stacked nanosheet semiconductor devices Kangguo Cheng, Juntao Li, Heng Wu 2020-02-25
10566430 Field effect transistor devices having gate contacts formed in active region overlapping source/drain contacts Kangguo Cheng 2020-02-18
10566095 Cold spray chromium coating for nuclear fuel rods Edward J. Lahoda, Zeses Karoutas, Sumit Ray, Kumar Sridharan, Benjamin Maier +1 more 2020-02-18
10564125 Self-aligned nanotips with tapered vertical sidewalls Juntao Li, Kangguo Cheng, Heng Wu 2020-02-18
10559685 Vertical field effect transistor with reduced external resistance Juntao Li, Kangguo Cheng, Choonghyun Lee 2020-02-11
10559675 Stacked silicon nanotubes Juntao Li, Kangguo Cheng, Choonghyun Lee 2020-02-11
10559491 Fabrication of vertical transport fin field effect transistors with a self-aligned separator and an isolation region with an air gap Kangguo Cheng, Zuoguang Liu, Sebastian Naczas, Heng Wu 2020-02-11
10553691 Field effect transistor devices having gate contacts formed in active region overlapping source/drain contacts Kangguo Cheng 2020-02-04
10553682 Vertical transistors with multiple gate lengths Zhenxing Bi, Kangguo Cheng, Zheng Xu 2020-02-04
10553495 Nanosheet transistors with different gate dielectrics and workfunction metals Kangguo Cheng, Choonghyun Lee, Juntao Li 2020-02-04