HJ

Hemanth Jagannathan

IBM: 220 patents #136 of 70,183Top 1%
RE Renesas Electronics: 2 patents #1,855 of 4,529Top 45%
TE Tessera: 2 patents #162 of 271Top 60%
SS Stmicroelectronics Sa: 2 patents #601 of 1,676Top 40%
Globalfoundries: 1 patents #2,221 of 4,424Top 55%
Stanford University: 1 patents #115 of 519Top 25%
ET Elpis Technologies: 1 patents #31 of 121Top 30%
📍 Niskayuna, NY: #3 of 949 inventorsTop 1%
🗺 New York: #109 of 115,490 inventorsTop 1%
Overall (All Time): #2,575 of 4,157,543Top 1%
225
Patents All Time

Issued Patents All Time

Showing 201–225 of 225 patents

Patent #TitleCo-InventorsDate
8835237 Robust replacement gate integration Sanjay C. Mehta 2014-09-16
8790991 Method and structure for shallow trench isolation to mitigate active shorts Jason E. Cummings, Balasubramanian S. Haran, Sanjay C. Mehta 2014-07-29
8779515 Semiconductor structure containing an aluminum-containing replacement gate electrode Sivananda K. Kanakasabapathy, David V. Horak 2014-07-15
8753934 Structure and method to integrate embedded DRAM with FinFET Sivananda K. Kanakasabapathy, Geng Wang 2014-06-17
8748991 Control of flatband voltages and threshold voltages in high-k metal gate stacks and structures for CMOS devices Takashi Ando, Vijay Narayanan 2014-06-10
8741757 Replacement gate electrode with multi-thickness conductive metallic nitride layers Vamsi K. Paruchuri 2014-06-03
8722548 Structures and techniques for atomic layer deposition Shintaro Aoyama, Robert D. Clark, Steven P. Consiglio, Marinus Hopstaken, Paul C. Jamison +4 more 2014-05-13
8679941 Method to improve wet etch budget in FEOL integration Jason E. Cummings, Lisa F. Edge, Balasubramanian S. Haran, David V. Horak, Sanjay C. Mehta 2014-03-25
8680629 Control of flatband voltages and threshold voltages in high-k metal gate stacks and structures for CMOS devices Takashi Ando, Vijay Narayanan 2014-03-25
8653610 High performance non-planar semiconductor devices with metal filled inter-fin gaps Sivananda K. Kanakasabapathy 2014-02-18
8614486 Low resistance source and drain extensions for ETSOI Balasubramanian S. Haran, Sivananda K. Kanakasabapathy, Sanjay C. Mehta 2013-12-24
8541275 Single metal gate CMOS integration by intermixing polarity specific capping layers Sivananda K. Kanakasabapathy, Matthew W. Copel 2013-09-24
8486778 Low resistance source and drain extensions for ETSOI Balasubramanian S. Haran, Sivananda K. Kanakasabapathy, Sanjay C. Mehta 2013-07-16
8421139 Structure and method to integrate embedded DRAM with finfet Sivananda K. Kanakasabapathy, Geng Wang 2013-04-16
8394684 Structure and method for stress latching in non-planar semiconductor devices Sivananda K. Kanakasabapathy, Sanjay C. Mehta 2013-03-12
8368146 FinFET devices Veeraraghavan S. Basker, David V. Horak, Charles W. Koburger, III 2013-02-05
8309447 Method for integrating multiple threshold voltage devices for CMOS Kangguo Cheng, Bruce B. Doris, Lisa F. Edge, Balasubramanian S. Haran, Ali Khakifirooz +1 more 2012-11-13
8304836 Structure and method to obtain EOT scaled dielectric stacks Takashi Ando, Lisa F. Edge, Sufi Zafar, Changhwan Choi, Paul C. Jamison +2 more 2012-11-06
8274116 Control of threshold voltages in high-k metal gate stack and structures for CMOS devices Takashi Ando, Vijay Narayanan 2012-09-25
8232179 Method to improve wet etch budget in FEOL integration Jason E. Cummings, Lisa F. Edge, Balasubramanian S. Haran, David V. Horak, Sanjay C. Mehta 2012-07-31
8133746 Method for semiconductor gate hardmask removal and decoupling of implants Sivananda K. Kanakasabapathy 2012-03-13
8124485 Molecular spacer layer for semiconductor oxide surface and high-K dielectric stack Dario L. Goldfarb, Dirk Pfeiffer 2012-02-28
7943458 Methods for obtaining gate stacks with tunable threshold voltage and scaling Sivananda K. Kanakasabapathy, Matthew W. Copel 2011-05-17
7855105 Planar and non-planar CMOS devices with multiple tuned threshold voltages Vijay Narayanan, Vamsi K. Paruchuri 2010-12-21
6789426 Microfluidic channels with integrated ultrasonic transducers for temperature measurement and method Goksen G. Yaralioglu, Arif Sanli Ergun, Butrus T. Khuri-Yakub 2004-09-14