Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10056306 | Test structure for monitoring interface delamination | Edward C. Cooney, III, Thomas Warren Weeks, Jr., Patrick S. Spinney, John C. S. Hall, Brian P. Conchieri +2 more | 2018-08-21 |
| 9825119 | Semiconductor device with metal extrusion formation | Max G. Levy, David C. Thomas | 2017-11-21 |
| 9825120 | Semiconductor device with metal extrusion formation | Max G. Levy, David C. Thomas | 2017-11-21 |
| 9577023 | Metal wires of a stacked inductor | Edward C. Cooney, III, Dinh Dang, David A. DeMuynck, Sarah A. McTaggart, Melissa J. Roma +2 more | 2017-02-21 |
| 9548349 | Semiconductor device with metal extrusion formation | Max G. Levy, David C. Thomas | 2017-01-17 |
| 9484301 | Controlled metal extrusion opening in semiconductor structure and method of forming | Max G. Levy, Matthew D. Moon, Anthony C. Speranza, Timothy D. Sullivan, David C. Thomas +1 more | 2016-11-01 |
| 9435948 | Silicon waveguide structure with arbitrary geometry on bulk silicon substrate, related systems and program products | Robert K. Leidy, Mark D. Levy, Qizhi Liu, Steven M. Shank | 2016-09-06 |
| 9231089 | Formation of an asymmetric trench in a semiconductor substrate and a bipolar semiconductor device having an asymmetric trench isolation region | Robert K. Leidy, Mark D. Levy, Qizhi Liu | 2016-01-05 |
| 9196592 | Methods of managing metal density in dicing channel and related integrated circuit structures | Edward C. Cooney, III, Jeffrey P. Gambino, Richard S. Graf | 2015-11-24 |
| 9059258 | Controlled metal extrusion opening in semiconductor structure and method of forming | Max G. Levy, Matthew D. Moon, Anthony C. Speranza, Timothy D. Sullivan, David C. Thomas +1 more | 2015-06-16 |
| 9059233 | Formation of an asymmetric trench in a semiconductor substrate and a bipolar semiconductor device having an asymmetric trench isolation region | Robert K. Leidy, Mark D. Levy, Qizhi Liu | 2015-06-16 |
| 8604618 | Structure and method for reducing vertical crack propagation | Edward C. Cooney, III, Jeffrey P. Gambino, Zhong-Xiang He, Xiao Hu Liu, Thomas L. McDevitt +1 more | 2013-12-10 |
| 7332054 | Etch apparatus | Arne Ballantine, Scott A. Estes, Emily E. Fisch, Ronald A. Warren | 2008-02-19 |
| 6699400 | Etch process and apparatus therefor | Arne Ballantine, Scott A. Estes, Emily E. Fisch, Ronald A. Warren | 2004-03-02 |
| 6576507 | Selectively removable filler layer for BiCMOS process | Kenneth Bandy, Stuart D. Cheney, Yutong Wu | 2003-06-10 |