Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10056306 | Test structure for monitoring interface delamination | Edward C. Cooney, III, Gary L. Milo, Thomas Warren Weeks, Jr., Patrick S. Spinney, John C. S. Hall +2 more | 2018-08-21 |
| 6917841 | Part number inhibit control | Bryan Rose, Steven Ruegsegger, Sylvia Tousley | 2005-07-12 |
| 6855207 | Apparatus and system for eliminating contaminants on a substrate surface | David Dussault, Mousa H. Ishaq | 2005-02-15 |
| 6715497 | Treatment to eliminate polysilicon defects induced by metallic contaminants | David Dussault, Mousa H. Ishaq | 2004-04-06 |
| 6697697 | Effective channel length control using ion implant feed forward | Steven Ruegsegger, John J. Ellis-Monaghan | 2004-02-24 |
| 6482660 | Effective channel length control using ion implant feed forward | Steven Ruegsegger, John J. Ellis-Monaghan | 2002-11-19 |