Issued Patents All Time
Showing 26–50 of 88 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9870960 | Capacitance monitoring using X-ray diffraction | Donghun Kang, Kriteshwar K. Kohli, Oh-Jung Kwon, Anita Madan | 2018-01-16 |
| 9859157 | Method for forming improved liner layer and semiconductor device including the same | Chih-Chao Yang | 2018-01-02 |
| 9859160 | Semiconductor device with reduced via resistance | Chih-Chao Yang | 2018-01-02 |
| 9748173 | Hybrid interconnects and method of forming the same | Chih-Chao Yang | 2017-08-29 |
| 9748169 | Treating copper interconnects | Chih-Chao Yang | 2017-08-29 |
| 9735051 | Semiconductor device interconnect structures formed by metal reflow process | Chih-Chao Yang | 2017-08-15 |
| 9476927 | Structure and method to determine through silicon via build integrity | Troy L. Graves-Abe, Chandrasekharan Kothandaraman | 2016-10-25 |
| 9443776 | Method and structure for determining thermal cycle reliability | Ronald G. Filippi, Jason P. Gill, Vincent J. McGahay, Paul S. McLaughlin, Hazara S. Rathore +2 more | 2016-09-13 |
| 9431354 | Activating reactions in integrated circuits through electrical discharge | Cyril Cabral, Jr., Gregory M. Fritz, Kenneth P. Rodbell | 2016-08-30 |
| 9349691 | Semiconductor device with reduced via resistance | Chih-Chao Yang | 2016-05-24 |
| 9287186 | Method and structure for determining thermal cycle reliability | Ronald G. Filippi, Jason P. Gill, Vincent J. McGahay, Paul S. McLaughlin, Hazara S. Rathore +2 more | 2016-03-15 |
| 9058887 | Reprogrammable electrical fuse | Louis C. Hsu, Chandrasekhar Narayan, Chih-Chao Yang | 2015-06-16 |
| 8802563 | Surface repair structure and process for interconnect applications | Chih-Chao Yang | 2014-08-12 |
| 8772161 | Annealing copper interconnects | Cyril Cabral, Jr., Gregory M. Fritz, Christian Lavoie, Kenneth P. Rodbell | 2014-07-08 |
| 8716037 | Measurement of CMOS device channel strain by X-ray diffraction | Thomas N. Adam, Stephen W. Bedell, Eric C. Harley, Judson R. Holt, Anita Madan +1 more | 2014-05-06 |
| 8716695 | Compressive (PFET) and tensile (NFET) channel strain in nanowire FETs fabricated with a replacement gate process | Guy M. Cohen, Michael A. Guillorn | 2014-05-06 |
| 8624395 | Redundancy design with electro-migration immunity and method of manufacture | Louis L. Hsu, Ping-Chuan Wang, Chih-Chao Yang | 2014-01-07 |
| 8564025 | Nanowire FET having induced radial strain | Sarunya Bangsaruntip, Guy M. Cohen, Jeffrey W. Sleight | 2013-10-22 |
| 8492208 | Compressive (PFET) and tensile (NFET) channel strain in nanowire FETs fabricated with a replacement gate process | Guy M. Cohen, Michael A. Guillorn | 2013-07-23 |
| 8450205 | Redundancy design with electro-migration immunity and method of manufacture | Louis L. Hsu, Ping-Chuan Wang, Chih-Chao Yang | 2013-05-28 |
| 8445892 | p-FET with a strained nanowire channel and embedded SiGe source and drain stressors | Guy M. Cohen, Michael J. Rooks | 2013-05-21 |
| 8405215 | Interconnect structure and method for Cu/ultra low k integration | Chih-Chao Yang | 2013-03-26 |
| 8399314 | p-FET with a strained nanowire channel and embedded SiGe source and drain stressors | Guy M. Cohen, Michael J. Rooks | 2013-03-19 |
| 8362600 | Method and structure to reduce soft error rate susceptibility in semiconductor structures | Cyril Cabral, Jr., Michael S. Gordon, David F. Heidel, Kenneth P. Rodbell, Henry Tang | 2013-01-29 |
| 8313990 | Nanowire FET having induced radial strain | Sarunya Bangsaruntip, Guy M. Cohen, Jeffrey W. Sleight | 2012-11-20 |