CL

Choonghyun Lee

IBM: 388 patents #42 of 70,183Top 1%
ET Elpis Technologies: 5 patents #4 of 121Top 4%
Samsung: 3 patents #30,683 of 75,807Top 45%
KF Korea University Research And Business Foundation: 2 patents #312 of 2,072Top 20%
SC Semes Co.: 2 patents #274 of 991Top 30%
TE Tessera: 1 patents #207 of 271Top 80%
📍 Rensselaer, NY: #1 of 101 inventorsTop 1%
🗺 New York: #33 of 115,490 inventorsTop 1%
Overall (All Time): #630 of 4,157,543Top 1%
401
Patents All Time

Issued Patents All Time

Showing 51–75 of 401 patents

Patent #TitleCo-InventorsDate
11362193 Inverse T-shaped contact structures having air gap spacers Kangguo Cheng, Juntao Li, Heng Wu, Peng Xu 2022-06-14
11362031 Integrated circuit device and method of manufacturing the same Joonyong Choe, Youngju Lee 2022-06-14
11355649 Nanosheet transistor having abrupt junctions between the channel nanosheets and the source/drain extension regions Kangguo Cheng, Juntao Li, Shogo Mochizuki 2022-06-07
11355553 Resistive random access memory integrated under a vertical field effect transistor Alexander Reznicek, Bahman Hekmatshoartabari, Tak H. Ning 2022-06-07
11342230 Homogeneous densification of fill layers for controlled reveal of vertical fins Kangguo Cheng, Juntao Li, Heng Wu, Peng Xu 2022-05-24
11329143 Nanosheet transistors with thin inner spacers and tight pitch gate Kangguo Cheng, Juntao Li, Peng Xu 2022-05-10
11322588 Contact source/drain resistance Fee Li Lie, Kangguo Cheng, Hemanth Jagannathan, Oleg Gluschenkov 2022-05-03
11322408 Forming shallow trench isolation regions for nanosheet field-effect transistor devices using sacrificial epitaxial layer Nicolas Loubet, Richard A. Conti 2022-05-03
11316015 Silicon germanium FinFET with low gate induced drain leakage current Shogo Mochizuki, Kangguo Cheng, Juntao Li 2022-04-26
11302813 Wrap around contact for nanosheet source drain epitaxy Alexander Reznicek, Xin Miao, Jingyun Zhang 2022-04-12
11302799 Method and structure for forming a vertical field-effect transistor Peng Xu, Kangguo Cheng, Juntao Li 2022-04-12
11282947 Heterojunction bipolar transistor with a silicon oxide layer on a silicon germanium base Injo Ok, Alexander Reznicek, Soon-Cheon Seo 2022-03-22
11271106 Replacement metal gate process for vertical transport field-effect transistor with self-aligned shared contacts Ruqiang Bao, Brent A. Anderson, Hemanth Jagannathan 2022-03-08
11257934 Fin field-effect transistors with enhanced strain and reduced parasitic capacitance Kangguo Cheng, Juntao Li, Shogo Mochizuki 2022-02-22
11257721 Replacement metal gate process for vertical transport field-effect transistors with multiple threshold voltages Ruqiang Bao, Hemanth Jagannathan, Brent A. Anderson 2022-02-22
11251285 Approach to control over-etching of bottom spacers in vertical fin field effect transistor devices Ruqiang Bao, Hemanth Jagannathan, Paul C. Jamison 2022-02-15
11251094 Oxygen vacancy passivation in high-k dielectrics for vertical transport field effect transistor Takashi Ando, Alexander Reznicek, Jingyun Zhang 2022-02-15
11245025 Gate last vertical transport field effect transistor Soon-Cheon Seo, Injo Ok, Alexander Reznicek 2022-02-08
11244870 Maskless top source/drain epitaxial growth on vertical transport field effect transistor Shogo Mochizuki, Injo Ok, Soon-Cheon Seo 2022-02-08
11239359 Fabricating a gate-all-around (GAA) field effect transistor having threshold voltage asymmetry by thinning source side lateral end portion of the nanosheet layer Jingyun Zhang, Takashi Ando, Pouya Hashemi, Alexander Reznicek 2022-02-01
11227937 Uniform interfacial layer on vertical fin sidewalls of vertical transport field-effect transistors Shogo Mochizuki, Kangguo Cheng, Juntao Li 2022-01-18
11217450 Device with pure silicon oxide layer on silicon-germanium layer Takashi Ando, Pouya Hashemi, Hemanth Jagannathan, Vijay Narayanan 2022-01-04
11211379 Fabrication of field effect transistors with different threshold voltages through modified channel interfaces Takashi Ando, Ruqiang Bao, Hemanth Jagannathan 2021-12-28
11211462 Using selectively formed cap layers to form self-aligned contacts to source/drain regions Chanro Park, Kangguo Cheng, Ruilong Xie 2021-12-28
11205728 Vertical field effect transistor with reduced parasitic capacitance Alexander Reznicek, Xin Miao, Jingyun Zhang 2021-12-21