Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
CY

Chih-Chao Yang — 888 Patents

IBM: 837 patents #5 of 70,183Top 1%
Globalfoundries: 21 patents #139 of 4,424Top 4%
ITITRI: 11 patents #451 of 9,619Top 5%
Infineon Technologies Ag: 8 patents #1,246 of 7,486Top 20%
TETessera: 7 patents #62 of 271Top 25%
UMUnited Microelectronics: 3 patents #1,523 of 4,560Top 35%
NLNational Applied Research Laboratories: 3 patents #58 of 506Top 15%
ETElpis Technologies: 2 patents #16 of 121Top 15%
NMNovatek Microelectronics: 1 patents #575 of 986Top 60%
CUClemson University: 1 patents #68 of 317Top 25%
GUGlobalfoundries U.S.: 1 patents #22 of 211Top 15%
Glenmont, NY: #1 of 67 inventorsTop 2%
New York: #4 of 115,490 inventorsTop 1%
Overall (All Time): #82 of 4,157,543Top 1%
888 Patents All Time

Issued Patents All Time

Showing 476–500 of 888 patents

Patent #TitleCo-InventorsDate
9786603 Surface nitridation in metal interconnects Lawrence A. Clevenger, Roger A. Quon, Terry A. Spooner, Wei Wang 2017-10-10
9786595 Antifuse having comb-like top electrode Praneet Adusumilli, Alexander Reznicek, Oscar van der Straten 2017-10-10
9786553 Advanced BEOL interconnect structure containing uniform air gaps 2017-10-10
9786605 Advanced through substrate via metallization in three dimensional semiconductor integration Daniel C. Edelstein 2017-10-10
9786596 Fuse formed from III-V aspect ratio structure Praneet Adusumilli, Alexander Reznicek, Oscar van der Straten 2017-10-10
9773735 Geometry control in advanced interconnect structures 2017-09-26
9773737 Advanced metallization for damage repair Daniel C. Edelstein 2017-09-26
9768118 Contact having self-aligned air gap spacers Juntao Li, Junli Wang 2017-09-19
9768276 Method and structure of forming FinFET electrical fuse structure Hong He, Juntao Li, Yunpeng Yin 2017-09-19
9761484 Interconnect structure and fabrication thereof 2017-09-12
9761529 Advanced metallization for damage repair Daniel C. Edelstein 2017-09-12
9754883 Hybrid metal interconnects with a bamboo grain microstructure Benjamin D. Briggs, Lawrence A. Clevenger, Michael Rizzolo 2017-09-05
9754885 Hybrid metal interconnects with a bamboo grain microstructure Benjamin D. Briggs, Lawrence A. Clevenger, Michael Rizzolo 2017-09-05
9748169 Treating copper interconnects Conal E. Murray 2017-08-29
9748173 Hybrid interconnects and method of forming the same Conal E. Murray 2017-08-29
9741577 Metal reflow for middle of line contacts Juntao Li, Junli Wang 2017-08-22
9735103 Electrical antifuse having airgap or solid core 2017-08-15
9735051 Semiconductor device interconnect structures formed by metal reflow process Conal E. Murray 2017-08-15
9728399 Simultaneous formation of liner and metal conductor Daniel C. Edelstein 2017-08-08
9721895 Self-formed liner for interconnect structures 2017-08-01
9722038 Metal cap protection layer for gate and contact metallization Praneet Adusumilli, Hemanth Jagannathan, Alexander Reznicek, Oscar van der Straten 2017-08-01
9721788 Simultaneous formation of liner and metal conductor Daniel C. Edelstein 2017-08-01
9721835 Modulating microstructure in interconnects Daniel C. Edelstein 2017-08-01
9716063 Cobalt top layer advanced metallization for interconnects Daniel C. Edelstein 2017-07-25
9716088 3D bonded semiconductor structure with an embedded capacitor Daniel C. Edelstein 2017-07-25