Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
CY

Chih-Chao Yang — 888 Patents

IBM: 837 patents #5 of 70,183Top 1%
Globalfoundries: 21 patents #139 of 4,424Top 4%
ITITRI: 11 patents #451 of 9,619Top 5%
Infineon Technologies Ag: 8 patents #1,246 of 7,486Top 20%
TETessera: 7 patents #62 of 271Top 25%
UMUnited Microelectronics: 3 patents #1,523 of 4,560Top 35%
NLNational Applied Research Laboratories: 3 patents #58 of 506Top 15%
ETElpis Technologies: 2 patents #16 of 121Top 15%
NMNovatek Microelectronics: 1 patents #575 of 986Top 60%
CUClemson University: 1 patents #68 of 317Top 25%
GUGlobalfoundries U.S.: 1 patents #22 of 211Top 15%
Glenmont, NY: #1 of 67 inventorsTop 2%
New York: #4 of 115,490 inventorsTop 1%
Overall (All Time): #82 of 4,157,543Top 1%
888 Patents All Time

Issued Patents All Time

Showing 451–475 of 888 patents

Patent #TitleCo-InventorsDate
9859433 Cobalt top layer advanced metallization for interconnects Daniel C. Edelstein 2018-01-02
9859218 Selective surface modification of interconnect structures Raghuveer R. Patlolla, Cornelius Brown Peethala, Roger A. Quon 2018-01-02
9859215 Formation of advanced interconnects Daniel C. Edelstein 2018-01-02
9859209 Advanced e-Fuse structure with enhanced electromigration fuse element Daniel C. Edelstein 2018-01-02
9859160 Semiconductor device with reduced via resistance Conal E. Murray 2018-01-02
9859157 Method for forming improved liner layer and semiconductor device including the same Conal E. Murray 2018-01-02
9852981 III-V compatible anti-fuses Praneet Adusumilli, Alexander Reznicek, Oscar van der Straten 2017-12-26
9852990 Cobalt first layer advanced metallization for interconnects Daniel C. Edelstein 2017-12-26
9853025 Thin film metallic resistors formed by surface treatment of insulating layer 2017-12-26
9847261 Metal reflow for middle of line contacts Juntao Li, Junli Wang 2017-12-19
9842805 Drive-in Mn before copper plating Hsueh-Chung Chen 2017-12-12
9837535 Directional deposition of protection layer Hong He, Juntao Li, Junli Wang 2017-12-05
9837356 Interconnect structures with enhanced electromigration resistance 2017-12-05
9831301 Metal resistor structures with nitrogen content 2017-11-28
9831181 Simultaneous formation of liner and metal conductor Daniel C. Edelstein 2017-11-28
9831182 Multiple pre-clean processes for interconnect fabrication Terry A. Spooner, Wei Wang 2017-11-28
9824917 Method and apparatus for single chamber treatment Daniel C. Edelstein 2017-11-21
9824967 Semiconductor resistor structures embedded in a middle-of-the-line (MOL) dielectric Praneet Adusumilli, Alexander Reznicek, Oscar van der Straten 2017-11-21
9812522 Metal-insulator-metal capacitor fabrication with unitary sputtering process Praneet Adusumilli, Alexander Reznicek, Oscar van der Straten 2017-11-07
9812391 Advanced metallization for damage repair Daniel C. Edelstein 2017-11-07
9806018 Copper interconnect structures Lawrence A. Clevenger, Wei Wang 2017-10-31
9806024 Simultaneous formation of liner and metal conductor Daniel C. Edelstein 2017-10-31
9799605 Advanced copper interconnects with hybrid microstructure Daniel C. Edelstein 2017-10-24
9793207 Electrical antifuse including phase change material 2017-10-17
9793156 Self-aligned low resistance metallic interconnect structures 2017-10-17