Issued Patents All Time
Showing 26–50 of 170 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8462330 | Method and apparatus for detecting defects | Hiroyuki Nakano, Toshihiko Nakata, Sachio Uto, Akira Hamamatsu, Yuta Urano | 2013-06-11 |
| 8437534 | Defect classification method and apparatus, and defect inspection apparatus | Hisae Shibuya, Akira Hamamatsu | 2013-05-07 |
| 8427634 | Defect inspection method and apparatus | Yuta Urano, Akira Hamamatsu, Kaoru Sakai | 2013-04-23 |
| 8410460 | Pattern defect inspection method and its apparatus | Minoru Yoshida, Hidetoshi Nishiyama, Masahiro Watanabe | 2013-04-02 |
| 8355123 | Defect inspection apparatus and its method | Akira Hamamatsu, Hisae Shibuya | 2013-01-15 |
| 8340395 | Defect inspection method and apparatus therefor | Kaoru Sakai | 2012-12-25 |
| 8310666 | Apparatus of inspecting defect in semiconductor and method of the same | Akira Hamamatsu, Hisae Shibuya | 2012-11-13 |
| 8310665 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Yoshimasa Oshima, Hisae Shibuya, Yuta Urano, Toshiyuki Nakao +1 more | 2012-11-13 |
| 8275190 | Method and apparatus for inspecting pattern defects | Kaoru Sakai, Takafumi Okabe | 2012-09-25 |
| 8274652 | Defect inspection system and method of the same | Yuta Urano, Kaoru Sakai | 2012-09-25 |
| 8270700 | Method and apparatus for pattern inspection | Kaoru Sakai, Hidetoshi Nishiyama | 2012-09-18 |
| 8253934 | Method and apparatus for inspecting a pattern formed on a substrate | Minoru Yoshida, Atsushi Shimoda, Kaoru Sakai, Takafumi Okabe, Masahiro Watanabe | 2012-08-28 |
| 8228494 | Apparatus for inspecting defects | Yukihiro Shibata | 2012-07-24 |
| 8218138 | Apparatus and method for inspecting defects | Hiroyuki Nakano, Akira Hamamatsu, Sachio Uto, Yoshimasa Oshima, Hidetoshi Nishiyama +1 more | 2012-07-10 |
| 8149396 | Defect inspection apparatus and its method | Akira Hamamatsu, Hisae Shibuya | 2012-04-03 |
| 8144337 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Yoshimasa Oshima, Hisae Shibuya, Yuta Urano, Toshiyuki Nakao +1 more | 2012-03-27 |
| 8139841 | Visual inspection method and apparatus and image analysis system | Hisae Shibuya | 2012-03-20 |
| 8107065 | Method and apparatus for detecting defects | Hiroyuki Nakano, Toshihiko Nakata, Sachio Uto, Akira Hamamatsu, Yuta Urano | 2012-01-31 |
| 8107717 | Defect inspection method and apparatus | Kenji Oka, Yukihiro Shibata, Minoru Yoshida, Chie Shishido, Yuji Takagi +2 more | 2012-01-31 |
| 8103087 | Fault inspection method | Kaoru Sakai | 2012-01-24 |
| 8090187 | Pattern inspection method and its apparatus | Kaoru Sakai, Takafumi Okabe, Hiroshi Goto, Masayuki Kuwabara, Naoya Takeuchi | 2012-01-03 |
| 8045149 | Apparatus for detecting defects using multiple coordinate systems | Minoru Yoshida | 2011-10-25 |
| 8004666 | Apparatus for inspecting defects | Yukihiro Shibata | 2011-08-23 |
| 8005292 | Method and apparatus for inspecting pattern defects | Kaoru Sakai, Takafumi Okabe | 2011-08-23 |
| 7987033 | Method for determining the morphology of an occupant in an automotive seat with capacitive sensors | Claude Launay, Joaquim Da Silva, Florent Voisin, Tomoaki Hirai, Takanori Ninomiya | 2011-07-26 |