Issued Patents All Time
Showing 26–50 of 55 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7355174 | Charged particle beam emitting device and method for adjusting the optical axis | Mitsugu Sato, Satoru Yamaguchi | 2008-04-08 |
| 7329868 | Charged particle beam apparatus | Atsushi Takane, Haruo Yoda, Hideo Todokoro, Fumio Mizuno, Shoji Yoshida +2 more | 2008-02-12 |
| 7315024 | Monochromator and scanning electron microscope using the same | Yoichi Ose, Shunroku Taya, Hideo Todokoro, Tadashi Otaka, Mitsugu Sato | 2008-01-01 |
| 7294835 | Scanning electron microscope | Hideo Todokoro, Yoichi Ose, Naomasa Suzuki | 2007-11-13 |
| 7282722 | Charged particle beam apparatus and charged particle beam irradiation method | Mitsugu Sato, Hideo Todokoro, Yoichi Ose, Noriaki Arai, Takashi Doi | 2007-10-16 |
| 7109485 | Charged particle beam apparatus | Atsushi Takane, Haruo Yoda, Hideo Todokoro, Fumio Mizuno, Shoji Yoshida +2 more | 2006-09-19 |
| 7087899 | Sample electrification measurement method and charged particle beam apparatus | Yoichi Ose, Akira Ikegami, Hideo Todokoro, Tatsuaki Ishijima, Takahiro Sato +2 more | 2006-08-08 |
| 7075078 | Scanning electron microscope | Yoichi Ose, Hideo Todokoro, Mitsugu Sato | 2006-07-11 |
| 7049591 | Scanning electron microscope | Hideo Todokoro, Yoichi Ose, Naomasa Suzuki | 2006-05-23 |
| 7022983 | Monochromator and scanning electron microscope using the same | Yoichi Ose, Shunroku Taya, Hideo Todokoro, Tadashi Otaka, Mitsugu Sato | 2006-04-04 |
| 6956211 | Charged particle beam apparatus and charged particle beam irradiation method | Mitsugu Sato, Hideo Todokoro, Yoichi Ose, Noriaki Arai, Takashi Doi | 2005-10-18 |
| 6946656 | Sample electrification measurement method and charged particle beam apparatus | Yoichi Ose, Akira Ikegami, Hideo Todokoro, Tatsuaki Ishijima, Takahiro Sato +2 more | 2005-09-20 |
| 6936818 | Charged particle beam apparatus | Atsushi Takane, Haruo Yoda, Hideo Todokoro, Fumio Mizuno, Shoji Yoshida +2 more | 2005-08-30 |
| 6885001 | Scanning electron microscope | Yoichi Ose, Hideo Todokoro, Mitsugu Sato | 2005-04-26 |
| 6872944 | Scanning electron microscope | Hideo Todokoro, Shou Takami, Osamu Yamada, Yoichi Ose, Tomohiro Kudo | 2005-03-29 |
| 6864493 | Charged particle beam alignment method and charged particle beam apparatus | Mitsugu Sato, Tadashi Otaka, Atsushi Takane, Shoji Yoshida, Satoru Yamaguchi +1 more | 2005-03-08 |
| 6847038 | Scanning electron microscope | Hideo Todokoro, Yoichi Ose, Naomasa Suzuki | 2005-01-25 |
| 6787772 | Scanning electron microscope | Yoichi Ose, Hideo Todokoro, Mitsugu Sato | 2004-09-07 |
| 6667476 | Scanning electron microscope | Hideo Todokoro, Shou Takami, Osamu Yamada, Yoichi Ose, Tomohiro Kudo | 2003-12-23 |
| 6653633 | Charged particle beam apparatus | Atsushi Takane, Haruo Yoda, Hideo Todokoro, Fumio Mizuno, Shoji Yoshida +2 more | 2003-11-25 |
| 6646262 | Scanning electron microscope | Hideo Todokoro, Yoichi Ose, Naomasa Suzuki | 2003-11-11 |
| 6635873 | Scanning electron microscope with voltage applied to the sample | Hideo Todokoro, Yasutsugu Usami | 2003-10-21 |
| 6538249 | Image-formation apparatus using charged particle beams under various focus conditions | Atsushi Takane, Haruo Yoda, Hideo Todokoro, Fumio Mizuno, Shoji Yoshida +2 more | 2003-03-25 |
| 6512228 | Scanning electron microscope | Hideo Todokoro, Sho Takami | 2003-01-28 |
| 6444981 | Scanning electron microscope | Hideo Todokoro, Sho Takami | 2002-09-03 |