Issued Patents All Time
Showing 76–93 of 93 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7326942 | Ion beam system and machining method | Hiroyasu Shichi, Yoshinori Nakayama, Masaki Hasegawa, Satoshi Tomimatsu | 2008-02-05 |
| 7268356 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Kaoru Umemura, Eiichi Seya +3 more | 2007-09-11 |
| 7242013 | Method for depositing a film using a charged particle beam, method for performing selective etching using the same, and charged particle beam equipment therefor | Hiroyasu Shichi | 2007-07-10 |
| 7205560 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2007-04-17 |
| 7205554 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2007-04-17 |
| 7200506 | Method for failure analysis and system for failure analysis | Satoshi Tomimatsu, Hiroyasu Shichi, Kaoru Umemura | 2007-04-03 |
| 7095021 | Method, apparatus and system for specimen fabrication by using an ion beam | Hiroyasu Shichi, Kaoru Umemura | 2006-08-22 |
| 6977376 | Method of prevention charging, and apparatus for charged particle beam using the same | Hiroyasu Shichi, Satoshi Tomimatsu | 2005-12-20 |
| 6927391 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2005-08-09 |
| 6894287 | Microfabrication apparatus and microfabrication method | Satoshi Tomimatsu, Hiroyasu Shichi, Osamu Watanabe | 2005-05-17 |
| 6858851 | Apparatus for specimen fabrication and method for specimen fabrication | Satoshi Tomimatsu, Hiroyasu Shichi | 2005-02-22 |
| 6838667 | Method and apparatus for charged particle beam microscopy | Ruriko Tsuneta, Masanari Koguchi, Mari Nozoe, Mitsugu Sato | 2005-01-04 |
| 6794663 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Kaoru Umemura, Eiichi Seya +3 more | 2004-09-21 |
| 6781125 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2004-08-24 |
| 6774363 | Method of preventing charging, and apparatus for charged particle beam using the same | Hiroyasu Shichi, Satoshi Tomimatsu | 2004-08-10 |
| 6717156 | Beam as well as method and equipment for specimen fabrication | Masakazu Sugaya, Hiroyasu Shichi, Kaoru Umemura, Hidemi Koike | 2004-04-06 |
| 6664552 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Kaoru Umemura, Eiichi Seya +3 more | 2003-12-16 |
| 6627889 | Apparatus and method for observing sample using electron beam | Isao Ochiai, Hidemi Koike, Satoshi Tomimatsu, Mitsugu Sato, Tohru Ishitani | 2003-09-30 |