HC

Huy Cao

Globalfoundries: 18 patents #182 of 4,424Top 5%
GU Globalfoundries U.S.: 2 patents #206 of 665Top 35%
IBM: 1 patents #44,794 of 70,183Top 65%
📍 Rexford, NY: #27 of 148 inventorsTop 20%
🗺 New York: #6,536 of 115,490 inventorsTop 6%
Overall (All Time): #205,968 of 4,157,543Top 5%
21
Patents All Time

Issued Patents All Time

Showing 1–21 of 21 patents

Patent #TitleCo-InventorsDate
11756786 Forming high carbon content flowable dielectric film with low processing damage Benjamin D. Briggs, Donald F. Canaperi, Thomas J. Haigh, Jr., Son V. Nguyen, Hosadurga Shobha +2 more 2023-09-12
10964599 Multi-step insulator formation in trenches to avoid seams in insulators Asli Sirman, Jiehui Shu, Chih-Chiang Chang, Haigou Huang, Jinping Liu 2021-03-30
10930549 Cap structure Jinsheng Gao, Daniel Jaeger, Chih-Chiang Chang, Michael V. Aquilino, Patrick Carpenter +3 more 2021-02-23
10460986 Cap structure Jinsheng Gao, Daniel Jaeger, Chih-Chiang Chang, Michael V. Aquilino, Patrick Carpenter +3 more 2019-10-29
10453751 Tone inversion method and structure for selective contact via patterning Xiaofeng Qiu, Michael V. Aquilino, Patrick Carpenter, Jessica Dechene, Ming Hao Tang +1 more 2019-10-22
10431500 Multi-step insulator formation in trenches to avoid seams in insulators Asli Sirman, Jiehui Shu, Chih-Chiang Chang, Haigou Huang, Jinping Liu 2019-10-01
10325819 Methods, apparatus and system for providing a pre-RMG replacement metal contact for a finFET device Jinsheng Gao, Daniel Jaeger, Michael V. Aquilino, Patrick Carpenter, Jessica Dechene +2 more 2019-06-18
10269654 Methods, apparatus and system for replacement contact for a finFET device Jinsheng Gao, Daniel Jaeger, Michael V. Aquilino, Patrick Carpenter, Jessica Dechene +2 more 2019-04-23
10256089 Replacement contact cuts with an encapsulated low-K dielectric Haigou Huang, Jinsheng Gao, Tai Fong Chao 2019-04-09
10056458 Siloxane and organic-based MOL contact patterning Chang Ho Maeng, Andy Wei, Anthony Ozzello, Bharat Krishnan, Guillaume Bouche +9 more 2018-08-21
10043753 Airgaps to isolate metallization features Zhiguo Sun, Joseph F. Shepard, Jr., Moosung Chae 2018-08-07
9991363 Contact etch stop layer with sacrificial polysilicon layer Haigou Huang, Jinsheng Gao, Haifeng Sheng, Jinping Liu, Hui Zang 2018-06-05
9793169 Methods for forming mask layers using a flowable carbon-containing silicon dioxide material Huang Liu, Guillaume Bouche, Songkram Srivathanakul 2017-10-17
9620381 Facilitating etch processing of a thin film via partial implantation thereof Suraj K. Patil, Hui Zhan, Huang Liu 2017-04-11
9589829 FinFET device including silicon oxycarbon isolation structure Daniel Jaeger, Guillaume Bouche 2017-03-07
9455204 10 nm alternative N/P doped fin for SSRW scheme Jinping Liu, Guillaume Bouche, Huang Liu 2016-09-27
9390979 Opposite polarity borderless replacement metal contact scheme Andy Wei, Guillaume Bouche, Jing Wan 2016-07-12
9330982 Semiconductor device with diffusion barrier film and method of manufacturing the same Songkram Srivathanakul, Jinping Liu, In-Soo Jung 2016-05-03
9318440 Formation of carbon-rich contact liner material Songkram Srivathanakul, Huang Liu, Garo Derderian, Boaz Alperson 2016-04-19
9130019 Formation of carbon-rich contact liner material Songkram Srivathanakul, Huang Liu, Garo Derderian, Boaz Alperson 2015-09-08
8940650 Methods for fabricating integrated circuits utilizing silicon nitride layers Huang Liu, Hoong Shing Wong, Songkram Srivathanakul, Sandeep Gaan 2015-01-27