Issued Patents All Time
Showing 51–75 of 230 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7714598 | Contact carriers (tiles) for populating larger substrates with spring contacts | Thomas H. Dozier, II, Igor Y. Khandros, Gaetan L. Mathieu, William D. Smith | 2010-05-11 |
| 7701243 | Electronic device testing using a probe tip having multiple contact features | Timothy E. Cooper, Igor Y. Khandros, Rod Martens, Gaetan L. Mathieu | 2010-04-20 |
| 7699616 | High density planar electrical interface | Charles A. Miller | 2010-04-20 |
| 7692433 | Sawing tile corners on probe card substrates | Roy J. Henson, Eric D. Hobbs, Peter B. Mathews, Makarand Shinde | 2010-04-06 |
| 7675311 | Wireless test system | Igor Y. Khandros, Charles A. Miller, A. Nicholas Sporck | 2010-03-09 |
| 7675301 | Electronic components with plurality of contoured microelectronic spring contacts | Stuart Wenzel | 2010-03-09 |
| 7674112 | Resilient contact element and methods of fabrication | John K. Gritters, Keith J. Breinlinger | 2010-03-09 |
| 7671614 | Apparatus and method for adjusting an orientation of probes | Eric D. Hobbs, Gaetan L. Mathieu, Makarand Shinde, Alexander H. Slocum | 2010-03-02 |
| 7659736 | Mechanically reconfigurable vertical tester interface for IC probing | Barbara Vasquez, Makarand Shinde, Gaetan L. Mathieu, A. Nicholas Sporck | 2010-02-09 |
| 7649368 | Wafer level interposer | Carl V. Reynolds | 2010-01-19 |
| 7642794 | Method and system for compensating thermally induced motion of probe cards | Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Makarand Shinde, Gaetan L. Mathieu | 2010-01-05 |
| 7634849 | Method of assembling and testing an electronics module | — | 2009-12-22 |
| 7621044 | Method of manufacturing a resilient contact | Gaetan L. Mathieu | 2009-11-24 |
| 7622935 | Probe card assembly with a mechanically decoupled wiring substrate | Eric D. Hobbs, Alexander H. Slocum, Keith J. Breinlinger, Shawn Powell | 2009-11-24 |
| 7618281 | Interconnect assemblies and methods | — | 2009-11-17 |
| 7616016 | Probe card assembly and kit | Igor Y. Khandros, A. Nicholas Sporck | 2009-11-10 |
| 7613591 | Remote test facility with wireless interface to local facilities | Igor Y. Khandros | 2009-11-03 |
| 7601039 | Microelectronic contact structure and method of making same | Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu | 2009-10-13 |
| 7592821 | Apparatus and method for managing thermally induced motion of a probe card assembly | Gary W. Grube, Eric D. Hobbs, Gaetan L. Mathieu, Makarand Shinde, Alexander H. Slocum +2 more | 2009-09-22 |
| 7593872 | Method and system for designing a probe card | Mark W. Brandemuehl, Stefan Graef, Yves Parent | 2009-09-22 |
| 7579269 | Microelectronic spring contact elements | Igor Y. Khandros, Gaetan L. Mathieu, David V. Pedersen | 2009-08-25 |
| 7560941 | Method and system for compensating thermally induced motion of probe cards | Rod Martens, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Makarand Shinde +1 more | 2009-07-14 |
| 7557596 | Test assembly including a test die for testing a semiconductor product die | Igor Y. Khandros, David V. Pedersen, Ralph G. Whitten | 2009-07-07 |
| 7555836 | Method of making lithographic contact elements | Gaetan L. Mathieu, Gary W. Grube | 2009-07-07 |
| 7553165 | Spring interconnect structures | Gaetan L. Mathieu, Gary W. Grube, Richard A. Larder | 2009-06-30 |