Issued Patents All Time
Showing 26–50 of 230 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7956633 | Stacked guard structures | — | 2011-06-07 |
| 7952375 | AC coupled parameteric test probe | A. Nicholas Sporck, Charles A. Miller | 2011-05-31 |
| 7948252 | Multilayered probe card | Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu, Poya Lotfizadeh, Chih-Chiang Tseng | 2011-05-24 |
| 7936177 | Providing an electrically conductive wall structure adjacent a contact structure of an electronic device | Keith J. Breinlinger, David Pritzkau | 2011-05-03 |
| 7930219 | Method and system for designing a probe card | Mark W. Brandemuehl, Stefan Graef, Yves Parent | 2011-04-19 |
| 7920989 | Remote test facility with wireless interface to local test facilities | Igor Y. Khandros | 2011-04-05 |
| 7898242 | Probe card assembly with an interchangeable probe insert | Carl V. Reynolds, Nobuhiro Kawamata, Takao Saeki | 2011-03-01 |
| 7897435 | Re-assembly process for MEMS structures | Gaetan L. Mathieu | 2011-03-01 |
| 7884006 | Method to build a wirebond probe card in a many at a time fashion | Bruce Barbara | 2011-02-08 |
| 7880489 | Printing of redistribution traces on electronic component | Yoshikazu Hatsukano, Igor Y. Khandros, Gaetan L. Mathieu | 2011-02-01 |
| 7868632 | Composite motion probing | Timothy E. Cooper, Igor Y. Khandros, Rod Martens, Gaetan L. Mathieu | 2011-01-11 |
| 7852094 | Sharing resources in a system for testing semiconductor devices | Matthew Chraft, Roy J. Henson, A. Nicholas Sporck | 2010-12-14 |
| 7845072 | Method and apparatus for adjusting a multi-substrate probe structure | Eric D. Hobbs, Lunyu Ma, Gaetan L. Mathieu, Steven T. Murphy, Makarand Shinde +1 more | 2010-12-07 |
| 7841863 | Spring interconnect structures | Gaetan L. Mathieu, Gary W. Grube, Richard A. Larder | 2010-11-30 |
| 7825674 | Probe card configuration for low mechanical flexural strength electrical routing substrates | Makarand Shinde, Richard A. Larder, Timothy E. Cooper, Ravindra V. Shenoy | 2010-11-02 |
| 7821255 | Test system with wireless communications | Igor Y. Khandros, Charles A. Miller, A. Nicholas Sporck | 2010-10-26 |
| 7808259 | Component assembly and alignment | Eric D. Hobbs, Gaetan L. Mathieu | 2010-10-05 |
| 7798822 | Microelectronic contact structures | Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu | 2010-09-21 |
| 7737709 | Methods for planarizing a semiconductor contactor | Gaetan L. Mathieu, Gary W. Grube | 2010-06-15 |
| 7732713 | Method to build robust mechanical structures on substrate surfaces | Gary W. Grube, Gaetan L. Mathieu, Chadwick D. Sofield | 2010-06-08 |
| 7733106 | Apparatus and method of testing singulated dies | Thomas H. Dozier, II, David S. Y. Hsu, Igor Y. Khandros, Charles A. Miller | 2010-06-08 |
| 7731503 | Carbon nanotube contact structures | John K. Gritters, Igor Y. Khandros, Rod Martens, Gaetan L. Mathieu | 2010-06-08 |
| 7724004 | Probing apparatus with guarded signal traces | Carl V. Reynolds, Takao Saeki, Yoichi Urakawa | 2010-05-25 |
| 7722371 | Electrical contactor, especially wafer level contactor, using fluid pressure | — | 2010-05-25 |
| 7714603 | Predictive, adaptive power supply for an integrated circuit under test | Charles A. Miller | 2010-05-11 |