BE

Benjamin N. Eldridge

FO Formfactor: 224 patents #1 of 177Top 1%
IBM: 1 patents #44,794 of 70,183Top 65%
📍 Danville, CA: #1 of 1,210 inventorsTop 1%
🗺 California: #415 of 386,348 inventorsTop 1%
Overall (All Time): #2,450 of 4,157,543Top 1%
230
Patents All Time

Issued Patents All Time

Showing 76–100 of 230 patents

Patent #TitleCo-InventorsDate
7550842 Integrated circuit assembly Igor Y. Khandros, Charles A. Miller, A. Nicholas Sporck, Gary W. Grube, Gaetan L. Mathieu 2009-06-23
7548055 Testing an electronic device using test data from a plurality of testers Igor Y. Khandros, Charles A. Miller, A. Nicholas Sporck 2009-06-16
7534654 Socket for making with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component David V. Pedersen, Igor Y. Khandros 2009-05-19
7524194 Lithographic type microelectronic spring structures with improved contours Stuart Wenzel 2009-04-28
7498825 Probe card assembly with an interchangeable probe insert Carl V. Reynolds, Nobuhiro Kawamata, Takao Saeki 2009-03-03
7488917 Electric discharge machining of a probe array Gaetan L. Mathieu, Gary W. Grube 2009-02-10
7482822 Apparatus and method for limiting over travel in a probe card assembly Timothy E. Cooper, Carl V. Reynolds, Ravindra V. Shenoy 2009-01-27
7471094 Method and apparatus for adjusting a multi-substrate probe structure Eric D. Hobbs, Lunyu Ma, Gaetan L. Mathieu, Steven T. Murphy, Makarand Shinde +1 more 2008-12-30
7463043 Methods of probing an electronic device Timothy E. Cooper, Igor Y. Khandros, Rod Martens, Gaetan L. Mathieu 2008-12-09
7458816 Shaped spring Gaetan L. Mathieu, Stuart Wenzel 2008-12-02
7459795 Method to build a wirebond probe card in a many at a time fashion Bruce Barbara 2008-12-02
7455540 Electrical contactor, especially wafer level contactor, using fluid pressure 2008-11-25
7435108 Variable width resilient conductive contact structures Gaetan L. Mathieu 2008-10-14
7400157 Composite wiring structure having a wiring block and an insulating layer with electrical connections to probes Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu, Poya Lotfizadeh, Chih-Chiang Tseng 2008-07-15
7396236 Wafer level interposer Carl V. Reynolds 2008-07-08
7385411 Method of designing a probe card apparatus with desired compliance characteristics 2008-06-10
7371072 Spring interconnect structures Gaetan L. Mathieu, Gary W. Grube, Richard A. Larder 2008-05-13
7352196 Probe card assembly and kit Igor Y. Khandros, A. Nicholas Sporck 2008-04-01
7347702 Contact carriers (tiles) for populating larger substrates with spring contacts Thomas H. Dozier, II, Igor Y. Khandros, Gaetan L. Mathieu, William D. Smith 2008-03-25
7342405 Apparatus for reducing power supply noise in an integrated circuit Charles A. Miller 2008-03-11
7335057 High density planar electrical interface Charles A. Miller 2008-02-26
7325302 Method of forming an interconnection element Gaetan L. Mathieu 2008-02-05
7312618 Method and system for compensating thermally induced motion of probe cards Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Makarand Shinde, Gaetan L. Mathieu 2007-12-25
7287322 Lithographic contact elements Gaetan L. Mathieu, Gary W. Grube 2007-10-30
7285968 Apparatus and method for managing thermally induced motion of a probe card assembly Gary W. Grube, Eric D. Hobbs, Gaetan L. Mathieu, Makarand Shinde, Alexander H. Slocum +2 more 2007-10-23