Issued Patents All Time
Showing 126–150 of 230 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7108546 | High density planar electrical interface | Charles A. Miller | 2006-09-19 |
| 7092902 | Automated system for designing and testing a probe card | Mark W. Brandemuehl, Stefan Graef, Yves Parent | 2006-08-15 |
| 7086149 | Method of making a contact structure with a distinctly formed tip structure | Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu | 2006-08-08 |
| 7084650 | Apparatus and method for limiting over travel in a probe card assembly | Timothy E. Cooper, Carl V. Reynolds, Ravindra V. Shenoy | 2006-08-01 |
| 7073254 | Method for mounting a plurality of spring contact elements | Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu | 2006-07-11 |
| 7071715 | Probe card configuration for low mechanical flexural strength electrical routing substrates | Makarand Shinde, Richard A. Larder, Timothy E. Cooper, Ravindra V. Shenoy | 2006-07-04 |
| 7071714 | Method and system for compensating for thermally induced motion of probe cards | Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Makarand Shinde, Gaetan L. Mathieu | 2006-07-04 |
| 7064566 | Probe card assembly and kit | Igor Y. Khandros, A. Nicholas Sporck | 2006-06-20 |
| 7061257 | Probe card assembly | Igor Y. Khandros, A. Nicholas Sporck | 2006-06-13 |
| 7059047 | Sockets for “springed” semiconductor devices | Thomas H. Dozier, II, Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu, David V. Pedersen +1 more | 2006-06-13 |
| 7053637 | Method for testing signal paths between an integrated circuit wafer and a wafer tester | Ralph G. Whitten | 2006-05-30 |
| 7048548 | Interconnect for microelectronic structures with enhanced spring characteristics | Gaetan L. Mathieu | 2006-05-23 |
| 7047638 | Method of making microelectronic spring contact array | Gaetan L. Mathieu, Carl V. Reynolds | 2006-05-23 |
| 7010854 | Re-assembly process for MEMS structures | Gaetan L. Mathieu | 2006-03-14 |
| 6972578 | Method and system for compensating thermally induced motion of probe cards | Rod Martens, Gary W. Grube, Ken S. Matsubayashi, Richard A. Larder, Makarand Shinde +1 more | 2005-12-06 |
| 6960923 | Probe card covering system and method | Carl V. Reynolds | 2005-11-01 |
| 6949942 | Predictive, adaptive power supply for an integrated circuit under test | Charles A. Miller | 2005-09-27 |
| 6948941 | Interconnect assemblies and methods | — | 2005-09-27 |
| 6939474 | Method for forming microelectronic spring structures on a substrate | Stuart Wenzel | 2005-09-06 |
| 6940093 | Special contact points for accessing internal circuitry of an integrated circuit | Igor Y. Khandros, David V. Pedersen, Ralph G. Whitten | 2005-09-06 |
| 6937037 | Probe card assembly for contacting a device with raised contact elements | Gary W. Grube, Gaetan L. Mathieu | 2005-08-30 |
| 6913468 | Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods | Thomas H. Dozier, II, Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu | 2005-07-05 |
| 6888362 | Test head assembly for electronic components with plurality of contoured microelectronic spring contacts | Stuart Wenzel | 2005-05-03 |
| 6864105 | Method of manufacturing a probe card | Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu, Poya Lotfizadeh, Chih-Chiang Tseng | 2005-03-08 |
| 6840374 | Apparatus and method for cleaning test probes | Igor Y. Khandros, Treliant Fang, Gaetan L. Mathieu, Gary W. Grube, Michael A. Drush +1 more | 2005-01-11 |