Issued Patents All Time
Showing 176–200 of 230 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6642625 | Sockets for “springed” semiconductor devices | Thomas H. Dozier, II, Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu, David V. Pederson +1 more | 2003-11-04 |
| 6640432 | Method of fabricating shaped springs | Gaetan L. Mathieu, Stuart Wenzel | 2003-11-04 |
| 6627980 | Stacked semiconductor device assembly with microelectronic spring contacts | — | 2003-09-30 |
| 6624648 | Probe card assembly | Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu | 2003-09-23 |
| 6621260 | Special contact points for accessing internal circuitry of an integrated circuit | Igor Y. Khandros, David V. Pedersen, Ralph G. Whitten | 2003-09-16 |
| 6616966 | Method of making lithographic contact springs | Gaetan L. Mathieu, Gary W. Grube | 2003-09-09 |
| 6615485 | Probe card assembly and kit, and methods of making same | Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu | 2003-09-09 |
| 6603324 | Special contact points for accessing internal circuitry of an integrated circuit | Igor Y. Khandros, David V. Pedersen, Ralph G. Whitten | 2003-08-05 |
| 6597187 | Special contact points for accessing internal circuitry of an integrated circuit | Igor Y. Khandros, David V. Pedersen, Ralph G. Whitten | 2003-07-22 |
| 6551844 | Test assembly including a test die for testing a semiconductor product die | Igor Y. Khandros, David V. Pedersen, Ralph G. Whitten | 2003-04-22 |
| 6534856 | Sockets for “springed” semiconductor devices | Thomas H. Dozier, II, Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu, David V. Pedersen +1 more | 2003-03-18 |
| 6520778 | Microelectronic contact structures, and methods of making same | Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu | 2003-02-18 |
| 6509751 | Planarizer for a semiconductor contactor | Gaetan L. Mathieu, Gary W. Grube | 2003-01-21 |
| 6491968 | Methods for making spring interconnect structures | Gaetan L. Mathieu, Gary W. Grube | 2002-12-10 |
| 6483328 | Probe card for probing wafers with raised contact elements | Gary W. Grube, Gaetan L. Mathieu | 2002-11-19 |
| 6482013 | Microelectronic spring contact element and electronic component having a plurality of spring contact elements | Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu | 2002-11-19 |
| 6479308 | Semiconductor fuse covering | — | 2002-11-12 |
| 6476630 | Method for testing signal paths between an integrated circuit wafer and a wafer tester | Ralph G. Whitten | 2002-11-05 |
| 6475822 | Method of making microelectronic contact structures | Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu | 2002-11-05 |
| 6468098 | Electrical contactor especially wafer level contactor using fluid pressure | — | 2002-10-22 |
| 6456103 | Apparatus for reducing power supply noise in an integrated circuit | Charles A. Miller | 2002-09-24 |
| 6456099 | Special contact points for accessing internal circuitry of an integrated circuit | Igor Y. Khandros, David V. Pedersen, Ralph G. Whitten | 2002-09-24 |
| 6441315 | Contact structures with blades having a wiping motion | Gary W. Grube, Igor Y. Khandros, Alec Madsen, Gaetan L. Mathieu | 2002-08-27 |
| 6429029 | Concurrent design and subsequent partitioning of product and test die | Igor Y. Khandros, David V. Pedersen, Ralph G. Whitten | 2002-08-06 |
| 6339338 | Apparatus for reducing power supply noise in an integrated circuit | Charles A. Miller | 2002-01-15 |