Issued Patents All Time
Showing 25 most recent of 56 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12236489 | Damage prediction system using artificial intelligence | Neil Pearson | 2025-02-25 |
| 11727500 | Damage prediction system using artificial intelligence | Neil Pearson | 2023-08-15 |
| 11430069 | Damage prediction system using artificial intelligence | Neil Pearson | 2022-08-30 |
| 10079942 | Methods and apparatus for implementing telemetry applications on a subscriber identity module | Dae Seong Kim, Syed Zaeem Hosain, Hein Dinh Ho, Scott Pedersen | 2018-09-18 |
| 8011089 | Method of repairing segmented contactor | Mohammad Eslamy, Harry D. Cobb | 2011-09-06 |
| 7714235 | Lithographically defined microelectronic contact structures | Igor Y. Khandros | 2010-05-11 |
| 7688090 | Wafer-level burn-in and test | Igor Y. Khandros | 2010-03-30 |
| 7579269 | Microelectronic spring contact elements | Benjamin N. Eldridge, Igor Y. Khandros, Gaetan L. Mathieu | 2009-08-25 |
| 7578057 | Method of fabricating segmented contactor | Mohammad Eslamy, Harry D. Cobb | 2009-08-25 |
| 7557596 | Test assembly including a test die for testing a semiconductor product die | Benjamin N. Eldridge, Igor Y. Khandros, Ralph G. Whitten | 2009-07-07 |
| 7534654 | Socket for making with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component | Benjamin N. Eldridge, Igor Y. Khandros | 2009-05-19 |
| 7345493 | Wafer-level burn-in and test | Igor Y. Khandros | 2008-03-18 |
| 7217580 | Method for processing an integrated circuit | Douglas S. Ondricek | 2007-05-15 |
| 7215131 | Segmented contactor | Mohammad Eslamy, Harry D. Cobb | 2007-05-08 |
| 7202677 | Socket for mating with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component | Benjamin N. Eldridge, Igor Y. Khandros | 2007-04-10 |
| 7078926 | Wafer-level burn-in and test | Igor Y. Khandros | 2006-07-18 |
| 7065870 | Segmented contactor | Mohammad Eslamy, Harry D. Cobb | 2006-06-27 |
| 7059047 | Sockets for “springed” semiconductor devices | Thomas H. Dozier, II, Benjamin N. Eldridge, Gary W. Grube, Igor Y. Khandros, Gaetan L. Mathieu +1 more | 2006-06-13 |
| 6940093 | Special contact points for accessing internal circuitry of an integrated circuit | Benjamin N. Eldridge, Igor Y. Khandros, Ralph G. Whitten | 2005-09-06 |
| 6825052 | Test assembly including a test die for testing a semiconductor product die | Benjamin N. Eldridge, Igor Y. Khandros, Ralph G. Whitten | 2004-11-30 |
| 6788094 | Wafer-level burn-in and test | Igor Y. Khandros | 2004-09-07 |
| 6766348 | Method and system for load-balanced data exchange in distributed network-based resource allocation | Charles D. Combs, Jeffrey J. Gold, Brian Mair, David Schear | 2004-07-20 |
| 6727580 | Microelectronic spring contact elements | Benjamin N. Eldridge, Igor Y. Khandros, Gaetan L. Mathieu | 2004-04-27 |
| 6690185 | Large contactor with multiple, aligned contactor units | Igor Y. Khandros, Ralph G. Whitten | 2004-02-10 |
| 6664628 | Electronic component overlapping dice of unsingulated semiconductor wafer | Igor Y. Khandros, Benjamin N. Eldridge, Richard S. Roy, Gaetan L. Mathieu | 2003-12-16 |