| 12385876 |
Methods of operating and calibrating a gas sensor, and related gas sensors |
Benjamin S. Rogers, Vaughn N. Hartung, Onnik Yaglioglu, Jesse D. Adams |
2025-08-12 |
|
| 12372488 |
Methods for determining at least one property of a material, and related detector |
Benjamin S. Rogers, Christopher J. Dudley, Jesse D. Adams, Alexander C. Woods, Vaughn N. Hartung |
2025-07-29 |
|
| 11709142 |
Methods for determining at least one property of a material |
Benjamin S. Rogers, Christopher J. Dudley, Jesse D. Adams, Alexander C. Woods, Vaughn N. Hartung |
2023-07-25 |
|
| 11262321 |
Systems and methods for determining at least one property of a material |
Benjamin S. Rogers, Christopher J. Dudley, Jesse D. Adams, Alexander C. Woods, Vaughn N. Hartung |
2022-03-01 |
|
| 10724976 |
Systems and methods for determining at least one property of a material |
Benjamin S. Rogers, Christopher J. Dudley, Jesse D. Adams, Alexander C. Woods, Vaughn N. Hartung |
2020-07-28 |
|
| 10453321 |
Pre-smoke detector and system for use in early detection of developing fires |
Jesse D. Adams |
2019-10-22 |
|
| 9922517 |
Pre-smoke detector and system for use in early detection of developing fires |
Jesse D. Adams |
2018-03-20 |
|
| 9625401 |
Molecular analysis using micro electro-mechanical sensor devices |
Jesse D. Adams, David R. Halbert, Joseph P. Barrus, Benjamin S. Rogers |
2017-04-18 |
|
| 9547968 |
Pre-smoke detector and system for use in early detection of developing fires |
Jesse D. Adams |
2017-01-17 |
|
| 7557596 |
Test assembly including a test die for testing a semiconductor product die |
Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen |
2009-07-07 |
$3,992,000 |
| 7053637 |
Method for testing signal paths between an integrated circuit wafer and a wafer tester |
Benjamin N. Eldridge |
2006-05-30 |
$23,014,000 |
| 6940093 |
Special contact points for accessing internal circuitry of an integrated circuit |
Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen |
2005-09-06 |
$4,942,000 |
| 6825052 |
Test assembly including a test die for testing a semiconductor product die |
Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen |
2004-11-30 |
$5,415,000 |
| 6724209 |
Method for testing signal paths between an integrated circuit wafer and a wafer tester |
Benjamin N. Eldridge |
2004-04-20 |
|
| 6690185 |
Large contactor with multiple, aligned contactor units |
Igor Y. Khandros, David V. Pedersen |
2004-02-10 |
$8,283,000 |
| 6621260 |
Special contact points for accessing internal circuitry of an integrated circuit |
Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen |
2003-09-16 |
$3,306,000 |
| 6603324 |
Special contact points for accessing internal circuitry of an integrated circuit |
Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen |
2003-08-05 |
$2,958,000 |
| 6597187 |
Special contact points for accessing internal circuitry of an integrated circuit |
Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen |
2003-07-22 |
$6,256,000 |
| 6551844 |
Test assembly including a test die for testing a semiconductor product die |
Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen |
2003-04-22 |
|
| 6476630 |
Method for testing signal paths between an integrated circuit wafer and a wafer tester |
Benjamin N. Eldridge |
2002-11-05 |
|
| 6456099 |
Special contact points for accessing internal circuitry of an integrated circuit |
Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen |
2002-09-24 |
|
| 6429029 |
Concurrent design and subsequent partitioning of product and test die |
Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen |
2002-08-06 |
|
| 6150199 |
Method for fabrication of programmable interconnect structure |
Richard L. Bechtel, Mammen Thomas, Hua-Thye Chua, Andrew K. Chan, John Birkner |
2000-11-21 |
$4,573,000 |
| 5989943 |
Method for fabrication of programmable interconnect structure |
Richard L. Bechtel, Mammen Thomas, Hua-Thye Chua, Andrew K. Chan, John Birkner |
1999-11-23 |
$6,211,000 |
| 5903041 |
Integrated two-terminal fuse-antifuse and fuse and integrated two-terminal fuse-antifuse structures incorporating an air gap |
Michael David La Fleur, Chun-Mai Liu, Alan Comer, Scott O. Graham, Yu-Lin Lee |
1999-05-11 |
|
