Issued Patents All Time
Showing 25 most recent of 33 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12385876 | Methods of operating and calibrating a gas sensor, and related gas sensors | Benjamin S. Rogers, Vaughn N. Hartung, Onnik Yaglioglu, Jesse D. Adams | 2025-08-12 |
| 12372488 | Methods for determining at least one property of a material, and related detector | Benjamin S. Rogers, Christopher J. Dudley, Jesse D. Adams, Alexander C. Woods, Vaughn N. Hartung | 2025-07-29 |
| 11709142 | Methods for determining at least one property of a material | Benjamin S. Rogers, Christopher J. Dudley, Jesse D. Adams, Alexander C. Woods, Vaughn N. Hartung | 2023-07-25 |
| 11262321 | Systems and methods for determining at least one property of a material | Benjamin S. Rogers, Christopher J. Dudley, Jesse D. Adams, Alexander C. Woods, Vaughn N. Hartung | 2022-03-01 |
| 10724976 | Systems and methods for determining at least one property of a material | Benjamin S. Rogers, Christopher J. Dudley, Jesse D. Adams, Alexander C. Woods, Vaughn N. Hartung | 2020-07-28 |
| 10453321 | Pre-smoke detector and system for use in early detection of developing fires | Jesse D. Adams | 2019-10-22 |
| 9922517 | Pre-smoke detector and system for use in early detection of developing fires | Jesse D. Adams | 2018-03-20 |
| 9625401 | Molecular analysis using micro electro-mechanical sensor devices | Jesse D. Adams, David R. Halbert, Joseph P. Barrus, Benjamin S. Rogers | 2017-04-18 |
| 9547968 | Pre-smoke detector and system for use in early detection of developing fires | Jesse D. Adams | 2017-01-17 |
| 7557596 | Test assembly including a test die for testing a semiconductor product die | Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen | 2009-07-07 |
| 7053637 | Method for testing signal paths between an integrated circuit wafer and a wafer tester | Benjamin N. Eldridge | 2006-05-30 |
| 6940093 | Special contact points for accessing internal circuitry of an integrated circuit | Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen | 2005-09-06 |
| 6825052 | Test assembly including a test die for testing a semiconductor product die | Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen | 2004-11-30 |
| 6724209 | Method for testing signal paths between an integrated circuit wafer and a wafer tester | Benjamin N. Eldridge | 2004-04-20 |
| 6690185 | Large contactor with multiple, aligned contactor units | Igor Y. Khandros, David V. Pedersen | 2004-02-10 |
| 6621260 | Special contact points for accessing internal circuitry of an integrated circuit | Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen | 2003-09-16 |
| 6603324 | Special contact points for accessing internal circuitry of an integrated circuit | Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen | 2003-08-05 |
| 6597187 | Special contact points for accessing internal circuitry of an integrated circuit | Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen | 2003-07-22 |
| 6551844 | Test assembly including a test die for testing a semiconductor product die | Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen | 2003-04-22 |
| 6476630 | Method for testing signal paths between an integrated circuit wafer and a wafer tester | Benjamin N. Eldridge | 2002-11-05 |
| 6456099 | Special contact points for accessing internal circuitry of an integrated circuit | Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen | 2002-09-24 |
| 6429029 | Concurrent design and subsequent partitioning of product and test die | Benjamin N. Eldridge, Igor Y. Khandros, David V. Pedersen | 2002-08-06 |
| 6150199 | Method for fabrication of programmable interconnect structure | Richard L. Bechtel, Mammen Thomas, Hua-Thye Chua, Andrew K. Chan, John Birkner | 2000-11-21 |
| 5989943 | Method for fabrication of programmable interconnect structure | Richard L. Bechtel, Mammen Thomas, Hua-Thye Chua, Andrew K. Chan, John Birkner | 1999-11-23 |
| 5903041 | Integrated two-terminal fuse-antifuse and fuse and integrated two-terminal fuse-antifuse structures incorporating an air gap | Michael David La Fleur, Chun-Mai Liu, Alan Comer, Scott O. Graham, Yu-Lin Lee | 1999-05-11 |